公开(公告)号：US20230326000A1

公开(公告)日：2023-10-12

申请号：US17857172

申请日：2022-07-05

Applicant: Materials Analysis Technology Inc.

Inventor： Hsiang-Yu Tsou ,  Hung-Jen Chen

IPC: G06T7/00

CPC classification number: G06T7/0002 ,  G06T2207/10061 ,  G06T2207/20096

Abstract: A curve alignment method and apparatus are provided. In the method, data obtained by at least one equipment analyzing a test sample is retrieved to generate test curves. In response to an alignment operation of directing a first point around a first curve to a second point around a second curve among the test curves, a correspondence between features corresponding to the first and second points is recorded, and correspondences of alignment operations are collected as feature data. Data obtained by the equipment analyzing a current sample is retrieved to generate current curves, and a third point matching the first feature on a third curve and a fourth point matching the second feature on a fourth curve are searched according to the correspondences. At least one of the third curve and the fourth curve is adjusted to align the third point with the fourth point.