公开(公告)号：US09887087B1

公开(公告)日：2018-02-06

申请号：US14325647

申请日：2014-07-08

Applicant: Michael Keith Fuller

Inventor： Michael Keith Fuller

IPC: H01L21/26 ,  H01L21/261 ,  H01L33/00 ,  H01L33/34 ,  H01L31/18 ,  H01L31/0288 ,  H01L35/34 ,  H01L35/22 ,  H01L29/167 ,  H01L29/06 ,  H01L29/66 ,  H01L21/78 ,  H01L21/18 ,  H01S5/32 ,  H01L21/66 ,  H01L31/0216

CPC classification number: H01L21/261 ,  H01L22/12 ,  H01L29/0634 ,  H01L29/66568 ,  H01L29/7802 ,  H01L31/02168 ,  H01L31/0288 ,  H01L31/1804 ,  H01L33/0054 ,  H01L33/343 ,  H01L35/22 ,  H01L35/34

Abstract: A method of manufacturing p-n junction in semiconductor material such that small dimensions of such junctions are maintained, and associated lattice dislocations of such junctions may be preferentially maintained, and devices with such patterned semiconductor material, is disclosed. Typically, a neutron moderator is used to slow fast neutrons to thermal energies. A mask made from thermal neutron absorbing material, such as cadmium, is placed in close proximity to such neutron moderator. Thermal neutron focusing optics, such as compound refractive lenses, are used to collect and focus thermal neutrons emitted from the mask such that the pattern or portion of the pattern is transferred to the silicon body, with neutrons transmitted from the window areas in the mask and through the neutron optic so as to form the donor dopant concentration for the n-type regions by transmutation of silicon atoms into phosphorus. An electronic device produced by such a method has vertical p-n junctions continuous between both major surfaces and horizontal alternating p-type and n-type regions across most of the face of the material, such that unique properties are achieved.

公开(公告)号：US20220328277A1

公开(公告)日：2022-10-13

申请号：US17300467

申请日：2021-07-12

Applicant: Michael Keith Fuller

Inventor： Michael Keith Fuller

IPC: H01J35/10 ,  H01J35/06 ,  H01J35/14

Abstract: An x-ray tube source is disclosed that allows differential phase shift, attenuation, and x-ray scattering features of an object to be acquired in a single exposure. Such multiplexed x-ray tube source includes multiple x-ray spot origins controlled in such a way that each slightly separated spot is temporally modulated “ON and OFF” at differing frequencies. In an x-ray interferometer system, such x-ray tube source forms multiple illumination beams of a single angular view of an object's feature but each with different interference fringe locations. A composite image can be acquired with a high frame-rate digital detector as a component element in such x-ray interferometer system. Such composite image can be subsequently de-multipexed and separately presented according to each spot-source illumination beam. Such isolated images of an object's feature, each having different fringe locations, allows for post-acquisition “fringe-mapping” analysis of the feature's full interaction with x-rays, including refraction, scattering, and absorption.

公开(公告)号：US09412481B1

公开(公告)日：2016-08-09

申请号：US13999172

申请日：2014-01-22

Applicant: Michael Keith Fuller

Inventor： Michael Keith Fuller

IPC: G21K1/10 ,  G01N23/20 ,  G01N23/201 ,  G01N23/04

CPC classification number: G21K1/10 ,  G01N23/04 ,  G01N23/201 ,  G21K1/065 ,  G21K2207/005

Abstract: A method and device is disclosed for the generation of high-contrast, localized sinusoidal patterns or stepped-intensity modulated patterns from spatially non-coherent or coherent illumination, and using such patterns for imaging the internal features of objects.

Abstract translation: 公开了用于从空间非相干或相干照明产生高对比度，局部正弦曲线图或阶梯强度调制图案的方法和装置，并且使用这种图案来成像物体的内部特征。

公开(公告)号：US20090060134A1

公开(公告)日：2009-03-05

申请号：US11985649

申请日：2007-11-17

Applicant: Michael Keith Fuller

Inventor： Michael Keith Fuller

IPC: G21K1/06

CPC classification number: G01N23/223 ,  A61B6/00 ,  A61B6/4092 ,  A61B6/482 ,  A61B6/484 ,  G01N23/04 ,  G01N2223/076 ,  G21K2201/06

Abstract: A system for observing the internal features of an object, such that the object's internal absorption, refraction, reflection and/or scattering properties are visualized, is disclosed. An embodiment may include one or more beams of penetrating radiation, an object with internal features to be imaged, a single or an array of radiation optics, and a detection system for capturing the resultant shadowgraph images. The beam(s) of radiation transmitted through the object typically originate from a line-shaped source(s), which has high spatial purity along the narrow axis, and low spatial purity in the perpendicular, long axis. In the long axis, radiation optic(s) capture and focus diverging rays exiting from the object to form a high resolution image of the object, without which optic(s) the shadowgraph would have blurring in this axis. Such shadowgraph is naturally well defined in the opposite axis of narrow beam origin and can reveal an object's refraction, reflection and/or scattering properties along that axis. An embodiment may also include discriminators (stops, phase shifters, analyzer crystals, etc.) in the beam exiting the object. An embodiment may also include mechanisms for scanning whereby a two-dimensional or three-dimensional image of a large object is made possible. An embodiment may also include an image of an object's internal features being derived from an analysis of the radiation and/or radiation waveform exiting the object.

Abstract translation: 公开了一种用于观察物体的内部特征的系统，使得物体的内部吸收，折射，反射和/或散射特性被可视化。 一个实施例可以包括一个或多个穿透辐射束，具有要成像的内部特征的物体，单个或一组辐射光学器件，以及用于捕获所得到的阴影图像的检测系统。 透过物体的辐射束通常来源于沿着窄轴具有高空间纯度和垂直长轴的空间纯度低的线状源。 在长轴上，辐射光学器件捕获并聚焦从物体出射的发散光线，以形成物体的高分辨率图像，而没有这些光学元件的阴影图将在该轴上具有模糊。 这样的阴影图自然界定在窄波束起源的相反轴线上，并且可以沿着该轴显示物体的折射，反射和/或散射特性。 实施例还可以包括离开物体的光束中的鉴别器（停止点，移相器，分析器晶体等）。 一个实施例还可以包括用于扫描的机构，从而可以实现大对象的二维或三维图像。 实施例还可以包括物体的内部特征的图像，其从离开物体的辐射和/或辐射波形的分析得到。

公开(公告)号：US11844641B2

公开(公告)日：2023-12-19

申请号：US17300467

申请日：2021-07-12

Applicant: Michael Keith Fuller

Inventor： Michael Keith Fuller

IPC: H01J35/10 ,  H01J35/26 ,  H01J35/28 ,  H01J35/30 ,  H05G1/52 ,  A61B6/00 ,  G01N23/041

CPC classification number: A61B6/484 ,  A61B6/4021 ,  H01J35/10 ,  H01J35/26 ,  H01J35/28 ,  H01J35/305 ,  H05G1/52 ,  A61B6/5205 ,  G01N23/041 ,  G21K2207/005 ,  H01J2235/068 ,  H01J2235/081 ,  H01J2235/086

Abstract: An x-ray tube source is disclosed that allows differential phase shift, attenuation, and x-ray scattering features of an object to be acquired in a single exposure. Such multiplexed x-ray tube source includes multiple x-ray spot origins controlled in such a way that each slightly separated spot is temporally modulated “ON and OFF” at differing frequencies. In an x-ray interferometer system, such x-ray tube source forms multiple illumination beams of a single angular view of an object's feature but each with different interference fringe locations. A composite image can be acquired with a high frame-rate digital detector as a component element in such x-ray interferometer system. Such composite image can be subsequently de-multipexed and separately presented according to each spot-source illumination beam. Such isolated images of an object's feature, each having different fringe locations, allows for post-acquisition “fringe-mapping” analysis of the feature's full interaction with x-rays, including refraction, scattering, and absorption.

公开(公告)号：US07505561B1

公开(公告)日：2009-03-17

申请号：US11985649

申请日：2007-11-17

Applicant: Michael Keith Fuller

Inventor： Michael Keith Fuller

IPC: G01N23/201 ,  G01N23/20

CPC classification number: G01N23/223 ,  A61B6/00 ,  A61B6/4092 ,  A61B6/482 ,  A61B6/484 ,  G01N23/04 ,  G01N2223/076 ,  G21K2201/06

Abstract: A system for observing the internal features of an object, such that the object's internal absorption, refraction, reflection and/or scattering properties are visualized, is disclosed. An embodiment may include one or more beams of penetrating radiation, an object with internal features to be imaged, a single or an array of radiation optics, and a detection system for capturing the resultant shadowgraph images. The beam(s) of radiation transmitted through the object typically originate from a line-shaped source(s), which has high spatial purity along the narrow axis, and low spatial purity in the perpendicular, long axis. In the long axis, radiation optic(s) capture and focus diverging rays exiting from the object to form a high resolution image of the object, without which optic(s) the shadowgraph would have blurring in this axis. Such shadowgraph is naturally well defined in the opposite axis of narrow beam origin and can reveal an object's refraction, reflection and/or scattering properties along that axis. An embodiment may also include discriminators (stops, phase shifters, analyzer crystals, etc.) in the beam exiting the object. An embodiment may also include mechanisms for scanning whereby a two-dimensional or three-dimensional image of a large object is made possible. An embodiment may also include an image of an object's internal features being derived from an analysis of the radiation and/or radiation waveform exiting the object.

Abstract translation: 公开了一种用于观察物体的内部特征的系统，使得物体的内部吸收，折射，反射和/或散射特性被可视化。 一个实施例可以包括一个或多个穿透辐射束，具有要成像的内部特征的物体，单个或一组辐射光学器件，以及用于捕获所得到的阴影图像的检测系统。 透过物体的辐射束通常来源于沿着窄轴具有高空间纯度和垂直长轴的空间纯度低的线状源。 在长轴上，辐射光学器件捕获并聚焦从物体出射的发散光线，以形成物体的高分辨率图像，而没有这些光学元件的阴影图将在该轴上具有模糊。 这样的阴影图自然界定在窄波束起源的相反轴线上，并且可以沿着该轴显示物体的折射，反射和/或散射特性。 实施例还可以包括离开物体的光束中的鉴别器（停止点，移相器，分析器晶体等）。 一个实施例还可以包括用于扫描的机构，从而可以实现大对象的二维或三维图像。 实施例还可以包括物体的内部特征的图像，其从离开物体的辐射和/或辐射波形的分析得到。