TERAHERTZ-WAVE DETECTOR
    2.
    发明专利

    公开(公告)号:CA2945597C

    公开(公告)日:2019-01-15

    申请号:CA2945597

    申请日:2015-04-15

    Applicant: NEC CORP

    Abstract: A terahertz-wave detector having a thermal separation structure in which a temperature detection unit 14 including a bolometer thin film 7 connected to electrode wiring 9 is supported so as to be lifted above a substrate 2 by a support part 13 including the electrode wiring 9 connected to a reading circuit 2a formed on the substrate 2, wherein the terahertz-wave detector is provided with a reflective film 3 that is formed on the substrate 2 and reflects terahertz waves and an absorption film 11 that is formed on the temperature detection unit 14 and absorbs terahertz waves and the reflective film 3 is integrally formed with the reflective film of an adjacent terahertz-wave detector.

    TERAHERTZ-WAVE DETECTOR
    3.
    发明专利

    公开(公告)号:CA2945597A1

    公开(公告)日:2015-10-22

    申请号:CA2945597

    申请日:2015-04-15

    Applicant: NEC CORP

    Abstract: A terahertz-wave detector having a thermal separation structure in which a temperature detection unit (14) including a bolometer thin film (7) connected to electrode wiring (9) is supported so as to be lifted above a substrate (2) by a support part (13) including electrode wiring (9) connected to a reading circuit (2a) formed on the substrate (2), wherein the terahertz-wave detector is provided with a reflective film (3) that is formed on the substrate (2) and reflects terahertz waves and an absorption film (11) that is formed on the temperature detection unit (14) and absorbs terahertz waves and the reflective film (3) is integrally formed with the reflective film of an adjacent terahertz-wave detector.

    TERAHERTZ-WAVE DETECTOR
    5.
    发明公开

    公开(公告)号:EP3133379A4

    公开(公告)日:2017-11-22

    申请号:EP15780439

    申请日:2015-04-15

    Applicant: NEC CORP

    Abstract: A terahertz-wave detector having a thermal separation structure in which a temperature detection unit 14 including a bolometer thin film 7 connected to electrode wiring 9 is supported so as to be lifted above a substrate 2 by a support part 13 including the electrode wiring 9 connected to a reading circuit 2a formed on the substrate 2, wherein the terahertz-wave detector is provided with a reflective film 3 that is formed on the substrate 2 and reflects terahertz waves and an absorption film 11 that is formed on the temperature detection unit 14 and absorbs terahertz waves and the reflective film 3 is integrally formed with the reflective film of an adjacent terahertz-wave detector.

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