公开(公告)号：US12298261B2

公开(公告)日：2025-05-13

申请号：US18013555

申请日：2021-07-02

Applicant: NUCTECH COMPANY LIMITED

Inventor： Zhiqiang Chen ,  Yuanjing Li ,  Shangmin Sun ,  Chunguang Zong ,  Yu Hu ,  Huaping Tang ,  Bicheng Liu ,  Weizhen Wang

IPC: G01N23/203

Abstract: The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.

公开(公告)号：US11822043B2

公开(公告)日：2023-11-21

申请号：US17420681

申请日：2020-01-03

Applicant: NUCTECH (BEIJING) COMPANY LIMITED ,  NUCTECH COMPANY LIMITED ,  TSINGHUA UNIVERSITY

Inventor： Zhiqiang Chen ,  Yuanjing Li ,  Li Zhang ,  Jianmin Li ,  Shangmin Sun ,  Chunguang Zong ,  Yu Hu ,  Quanwei Song ,  Hejun Zhou ,  Weifeng Yu ,  Jinguo Cao ,  Bing Fu

IPC: G01N23/04 ,  G01N23/083 ,  G01N23/087 ,  G01N23/10 ,  G01V5/00 ,  G01N23/18

CPC classification number: G01V5/0066 ,  G01N23/04 ,  G01N23/083 ,  G01N23/087 ,  G01N23/10 ,  G01N23/18 ,  G01V5/0008 ,  G01V5/0016 ,  G01V5/0041 ,  G01N2223/04 ,  G01N2223/3303 ,  G01N2223/40 ,  G01N2223/639

Abstract: The present disclosure provides a radiation inspection apparatus and a radiation inspection method. The radiation inspection apparatus includes: a radiation inspection device comprising a ray source and a detector that cooperates with the ray source to perform scanning inspection on an object to be inspected, the radiation inspection device having an inspection channel for the object to be inspected to pass through when scanning inspection is performed thereon; and traveling wheels provided at the bottom of the radiation inspection device to enable the radiation inspection apparatus to travel in an extension direction of the inspection channel, and the traveling wheels are configured to rotate 90° to enable the radiation inspection apparatus to travel in a direction perpendicular to the extension direction of the inspection channel.

公开(公告)号：US11822040B2

公开(公告)日：2023-11-21

申请号：US17255394

申请日：2020-01-06

Applicant: TSINGHUA UNIVERSITY ,  NUCTECH (BEIJING) COMPANY LIMITED ,  NUCTECH COMPANY LIMITED

Inventor： Yanwei Xu ,  Weifeng Yu ,  Yu Hu ,  Chunguang Zong ,  Shangmin Sun

IPC: G01S17/894 ,  G01V5/00

CPC classification number: G01V5/0016 ,  G01S17/894 ,  G06V2201/08

Abstract: The present disclosure relates to a security scanning inspection system and method. The security scanning inspection system comprises a detector, a scanning device and a controller, wherein the detector is configured to detect a protective attribute of an object to be inspected; the scanning device is movably arranged and the scanning device is configured to emit a scanning ray during movement to perform a security scanning inspection on the object to be inspected, the scanning device comprising at least two working modes, wherein a dose of a scanning ray in each working mode is different from a dose of a scanning ray in any other working modes; and the controller configured to select a working mode of the scanning device according to the protective attribute of the object to be inspected detected by the detector.

公开(公告)号：US10895660B2

公开(公告)日：2021-01-19

申请号：US16234630

申请日：2018-12-28

Applicant: NUCTECH COMPANY LIMITED ,  TSINGHUA UNIVERSITY

Inventor： Hao Yu ,  Ying Li ,  Weizhen Wang ,  Quanwei Song ,  Dongyu Wang ,  Haojie Chi ,  Jianmin Li ,  Yulan Li ,  Chunguang Zong ,  Zhiqiang Chen ,  Yuanjing Li ,  Li Zhang

IPC: G01N23/203 ,  G01V5/00

Abstract: The present disclosure discloses a vehicle-mounted type back scattering inspection system. The back scattering imaging device has a vehicle-mounted working state and a ground working state, and in the vehicle-mounted working state, the back scattering imaging device performs inspection work in a carriage; in the ground working state, the back scattering imaging device performs the inspection work on the ground at the outside of the carriage; and the back scattering imaging device is separately arranged relative to the carriage and is movable between the carriage and the ground to switch between the vehicle-mounted working state and the ground working state.

公开(公告)号：US12020518B2

公开(公告)日：2024-06-25

申请号：US17421709

申请日：2020-01-23

Applicant: NUCTECH COMPANY LIMITED ,  NUCTECH (BEIJING) COMPANY LIMITED ,  TSINGHUA UNIVERSITY

Inventor： Yongming Wang ,  Junjie Tu ,  Chuan Gao ,  Yanwei Xu ,  Weifeng Yu ,  Chunguang Zong ,  Yu Hu

IPC: G07C5/08 ,  B60W40/10

CPC classification number: G07C5/0825 ,  B60W40/10 ,  G07C5/0808 ,  B60W2554/4041 ,  B60W2554/4049

Abstract: This disclosure provides a vehicle inspection method, apparatus, system, and computer-readable storage medium and relates to the field of security inspection technologies. The vehicle inspection method of the present disclosure includes: acquiring vehicle profile information of a vehicle through a first sensor that performs measurement in a direction perpendicular to a passage, and determining a feature point of the vehicle according to the vehicle profile information; determining a position of the vehicle in the passage through a second sensor that performs measurement in a direction along the passage, and determining a position of the feature point according to the position of the vehicle in the passage; and switching an operating mode of a ray source based on a preset strategy according to a position relation between the position of the feature point and the ray source.

公开(公告)号：US10996369B2

公开(公告)日：2021-05-04

申请号：US16234632

申请日：2018-12-28

Applicant: NUCTECH COMPANY LIMITED ,  TSINGHUA UNIVERSITY

Inventor： Hao Yu ,  Ying Li ,  Weizhen Wang ,  Quanwei Song ,  Dongyu Wang ,  Haojie Chi ,  Jianmin Li ,  Yulan Li ,  Chunguang Zong ,  Zhiqiang Chen ,  Yuanjing Li ,  Li Zhang

IPC: G01N23/203 ,  G01V5/00

Abstract: The present disclosure discloses a vehicle-mounted type back scattering inspection system. The vehicle-mounted type back scattering inspection system includes a carriage and a back scattering imaging device, the scanning range of the back scattering imaging device is variable. As the scanning range of the back scattering imaging device of the present disclosure is variably set, the inspection range of the back scattering imaging device can be expanded.

公开(公告)号：US10782246B2

公开(公告)日：2020-09-22

申请号：US15827739

申请日：2017-11-30

Applicant: Nuctech Company Limited ,  Tsinghua University

Inventor： Chunguang Zong ,  Ying Li ,  Hejun Zhou ,  Quanwei Song ,  Jianmin Li ,  Yulan Li ,  Yuanjing Li ,  Li Zhang ,  Zhiqiang Chen

IPC: G01N23/04 ,  G01N21/90 ,  G01V5/00 ,  G01N21/01

Abstract: A movable ray inspection system used to be mounted in a container yard to inspect an object within a container is provided. The movable ray inspection system includes: a ray generator device configured to emit a ray, a ray receiving device configured to receive the ray, and at least one chamber for receiving the ray generator device and the ray receiving device therein. Each of the at least one chamber is configured to be a standard container or a chamber which has a same shape, a same size and a same structure as a standard container such that the movable ray inspection system is adapted to be stacked in the container yard.

公开(公告)号：US20200025968A1

公开(公告)日：2020-01-23

申请号：US16232058

申请日：2018-12-26

Applicant: TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED

Inventor： Yigang YANG ,  Dongyu Wang ,  Hao Yu ,  Quanwei Song ,  Jianmin Li ,  Weizhen Wang ,  Yulan Li ,  Chunguang Zong ,  Qinjian Zhang ,  Ming Zeng ,  Zhiqiang Chen ,  Yuanjing Li ,  Li Zhang

IPC: G01V5/00 ,  G01N23/20

Abstract: The present disclosure discloses a radiation inspection system and a radiation inspection method. The radiation inspection system comprises a radiation source and a beam modulating device. The beam modulating device comprises a first collimating structure disposed at a beam exit side of the radiation source and a second collimating structure disposed at a beam exit side of the first collimating structure. The second collimating structure is movable relative to the first collimating structure to change a relative position of the first collimating port of the first collimating structure with the second collimating port of the second collimating structure, and the beam modulating device is shifted between a first operational state in which the beam modulating device modulates an initial beam into a fan beam, and a second operational state in which the beam modulating device modulates the initial beam into a pencil beam variable in position.

公开(公告)号：US10379252B2

公开(公告)日：2019-08-13

申请号：US15217787

申请日：2016-07-22

Applicant: Tsinghua University ,  NUCTECH COMPANY LIMITED

Inventor： Zhiqiang Chen ,  Yuanjing Li ,  Li Zhang ,  Ziran Zhao ,  Yaohong Liu ,  Juan Zheng ,  Jianping Gu ,  Chunguang Zong

IPC: G01V5/00 ,  G01N23/04 ,  G01N23/046 ,  G01N23/06 ,  G01N23/083 ,  G01N23/087 ,  G01N23/10 ,  G01V5/12

Abstract: Disclosed is a method and device for estimating weight of an object to be inspected in an inspection system. An effective atomic number and a high-energy gray value of the dual-energy corresponding to each pixel of the object to be inspected are obtained by a dual-energy radiation scanning. A mass-thickness value for a corresponding pixel is obtained from a pre-created mass-thickness attenuation curve by utilizing the effective atomic numbers and the high-energy gray value of the dual-energy for respective pixels. Weight information for at least a part of the object to be inspected is calculated by multiplying the mass-thickness value by the area of the pixel. Such a method may accurately calculate the weight of the object to be inspected and save the cost for a conventional weighing hardware.

公开(公告)号：US11614413B2

公开(公告)日：2023-03-28

申请号：US17255968

申请日：2020-01-03

Applicant: TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED ,  NUCTECH (BEIJING) COMPANY LIMITED

Inventor： Jianmin Li ,  Li Zhang ,  Yuanjing Li ,  Zhiqiang Chen ,  Hao Yu ,  Shangmin Sun ,  Bicheng Liu ,  Weizhen Wang ,  Dongyu Wang ,  Yuan Ma ,  Yu Hu ,  Chunguang Zong

IPC: G01N23/20008 ,  G01N23/203

Abstract: The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.