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    SELF-CONTAINED MULTIVARIATE OPTICAL COMPUTING AND ANALYSIS SYSTEM
    1.
    发明申请
    SELF-CONTAINED MULTIVARIATE OPTICAL COMPUTING AND ANALYSIS SYSTEM 审中-公开
    自包含多种光学计算和分析系统

    公开(公告)号：WO2008057905A2

    公开(公告)日：2008-05-15

    申请号：PCT/US2007083280

    申请日：2007-11-01

    Applicant: OMETRIC CORP ,  FREESE ROBERT P ,  TEAGUE TERRELL K ,  PERKINS DAVID L ,  SOLTMANN WILLIAM J

    Inventor： FREESE ROBERT P ,  TEAGUE TERRELL K ,  PERKINS DAVID L ,  SOLTMANN WILLIAM J

    IPC: G01J3/28

    CPC classification number: G01J3/4338 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0264 ,  G01N21/255 ,  G01N21/31 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/4738 ,  G01N2021/1793 ,  G01N2201/0691 ,  G01N2201/0693 ,  G01N2201/1293

    Abstract: An optical analysis system includes a light source configured to radiate a first light along a first ray path; a modulator disposed in the first ray path, the modulator configured to modulate the first light to a desired frequency; a spectral element disposed proximate the modulator, the spectral element configured to filter the first light for a spectral range of interest of a sample; a cavity in communication with the spectral element, the cavity configured to direct the first light in a direction of the sample; a conical mirror configured to convert the first light reflecting from the sample into a second light, the cavity being further configured to direct the second light; a beamsplitter configured to split the second light into a first beam and a second beam; an optical filter mechanism disposed to receive the first beam, the optical filter mechanism configured to optically filter data carried by the first beam into at least one orthogonal component of the first beam; a first detector mechanism in communication with the optical filter mechanism to measure a property of the orthogonal component to measure the data; a second detector mechanism configured to receive the second beam for comparison of the property of the orthogonal component to the second beam; an accelerometer configured to control the data acquisition such that only detector signals during the period of time when the system is in the proper orientation such that the material sample (e.g., aspirin) is in proximity to the interrogation window are used for calculation; a computer having a data acquisition and conversion card, the computer disposed in the system in communication with the first and second detector mechanisms for signal processing; and a battery and charging system disposed in the system in electrical communication with the system to provide stand-alone operation capability.

    Abstract translation: 光学分析系统包括被配置为沿第一射线路径辐射第一光的光源; 调制器，设置在第一射线路径中，调制器被配置为将第一光调制到期望的频率; 设置在所述调制器附近的光谱元件，所述光谱元件被配置为过滤所述第一光以获得样品的感兴趣的光谱范围; 与所述光谱元件连通的空腔，所述空腔被配置为沿所述样品的方向引导所述第一光; 锥形镜，被配置为将从样品反射的第一光转换成第二光，所述空腔进一步构造成引导第二光; 分束器，被配置为将所述第二光分成第一光束和第二光束; 滤光器机构，设置成接收第一光束，滤光器机构被配置为将由第一光束承载的数据光学滤波成第一光束的至少一个正交分量; 与所述光学滤波器机构通信以测量所述正交分量的属性以测量所述数据的第一检测器机构; 第二检测器机构，其被配置为接收所述第二光束，用于将所述正交分量的属性与所述第二光束进行比较; 加速度计被配置为控制数据采集，使得仅在系统处于正确定向的时间段内的检测器信号才能使材料样品（例如阿司匹林）接近询问窗口进行计算; 具有数据获取和转换卡的计算机，所述计算机设置在与所述第一和第二检测器机构通信以进行信号处理的系统中; 以及设置在系统中与系统电连通以提供独立操作能力的电池和充电系统。

    IN-LINE PROCESS MEASUREMENT SYSTEMS AND METHODS
    2.
    发明公开
    IN-LINE PROCESS MEASUREMENT SYSTEMS AND METHODS 审中-公开
    MESSSYSTEME UND-EXFAHRENFÜRINLINE-VERFAHREN

    公开(公告)号：EP2140238A4

    公开(公告)日：2013-05-01

    申请号：EP08799741

    申请日：2008-03-27

    Applicant: OMETRIC CORP

    Inventor： PERKINS DAVID L ,  FREESE ROBERT P ,  BLACKBURN JOHN C ,  JAMES JONATHAN H

    IPC: G01J3/45

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0264 ,  G01J3/0291 ,  G01J3/42 ,  G01N21/31

    Abstract: A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.

    Abstract translation: 一种使用多变量光学计算实时地收集关于过程流的瞬时数据的方法包括：在过程线附近安装光学分析系统，所述过程线被配置为使材料移动通过所述光学分析系统的窗口; 用来自光学分析系统的光照射材料的一部分; 通过所述光学分析系统中的至少一个多元光学元件引导关于所述部分的光的信息传输信息，以产生关于该部分的瞬时测量结果; 并且在一段时间内连续平均瞬时测量结果以确定材料的总体测量信号。

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