METHOD FOR DETECTING AND ANALYZING SURFACE FILMS
    2.
    发明申请
    METHOD FOR DETECTING AND ANALYZING SURFACE FILMS 审中-公开
    检测和分析表面膜的方法

    公开(公告)号:WO2016057990A3

    公开(公告)日:2016-08-18

    申请号:PCT/US2015055102

    申请日:2015-10-12

    Applicant: ORTHOBOND INC

    CPC classification number: G01J3/443 G01N21/73 G01N21/8422

    Abstract: Disclosed herein are embodiments of a novel method and system to analyze films using plasma to produce spectral data and analyzing the spectral data. A method of analyzing a film comprising: contacting the film with plasma to produce spectral lines; and analyzing the spectral lines.

    Abstract translation: 本文公开了一种用等离子体分析膜以产生光谱数据并分析光谱数据的新颖方法和系统的实施例。 一种分析薄膜的方法,包括:使薄膜与等离子体接触以产生光谱线; 并分析谱线。

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