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1.发明申请X-RAY PHASE CONTRAST IMAGING USING A FABRY-PEROT INTERFEROMETER CONCEPT 审中-公开使用FABRY-PEROT干涉仪概念的X射线相位对比成像
公开(公告)号：WO02071028A2
公开(公告)日：2002-09-12
申请号：PCT/US0206723
申请日：2002-03-01
Applicant: OSMIC INC
Inventor： MARTYNOV VLADIMIR V , PLATONOV YURIY
CPC classification number: B82Y10/00 , G21K1/06 , G21K1/062 , G21K2207/005
Abstract: An analyzer that includes a first multilayer structure and a second multilayer structure deposited on the spacer material.
Abstract translation: 一种分析仪，其包括沉积在间隔物材料上的第一多层结构和第二多层结构。
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公开(公告)号：DE60221394T2
公开(公告)日：2008-04-17
申请号：DE60221394
申请日：2002-06-27
Applicant: OSMIC INC
Inventor： MARTYNOV VLADIMIR V , PLATONOV YURIY
Abstract: The invention relates to a grating (20) comprising: a multi-layer structure (26) comprising: alternating layers of materials; a plurality of grooves (30) formed between a plurality of lands (32), wherein at least one structural parameter of said plurality of grooves and plurality of lands is formed randomly in said multi-layer structure.
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Patent Agency Ranking
公开(公告)号：AU2002258469A1
公开(公告)日：2002-09-19
申请号：AU2002258469
申请日：2002-03-01
Applicant: OSMIC INC
Inventor： MARTYNOV VLADIMIR V , PLATONOV YURIY
Abstract: An analyzer that includes a first multilayer structure, a spacer material deposited on the first multilayer structure and a second multilayer structure deposited on the spacer material.
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公开(公告)号：DE60232556D1
公开(公告)日：2009-07-16
申请号：DE60232556
申请日：2002-06-27
Applicant: OSMIC INC
Inventor： MARTYNOV VLADIMIR V , PLATONOV YURIY
Abstract: The invention relates to a grating (20) comprising: a multi-layer structure (26) comprising: alternating layers of materials; a plurality of grooves (30) formed between a plurality of lands (32), wherein at least one structural parameter of said plurality of grooves and plurality of lands is formed randomly in said multi-layer structure.
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公开(公告)号：DE60221394D1
公开(公告)日：2007-09-06
申请号：DE60221394
申请日：2002-06-27
Applicant: OSMIC INC
Inventor： MARTYNOV VLADIMIR V , PLATONOV YURIY
Abstract: The invention relates to a grating (20) comprising: a multi-layer structure (26) comprising: alternating layers of materials; a plurality of grooves (30) formed between a plurality of lands (32), wherein at least one structural parameter of said plurality of grooves and plurality of lands is formed randomly in said multi-layer structure.
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6.发明公开X-RAY PHASE CONTRAST IMAGING USING A FABRY-PEROT INTERFEROMETER CONCEPT 有权相位对比X-RAY使用法布里 - 珀罗干涉APPROACH
公开(公告)号：EP1449037A4
公开(公告)日：2007-12-26
申请号：EP02728415
申请日：2002-03-01
Applicant: OSMIC INC
Inventor： MARTYNOV VLADIMIR V , PLATONOV YURIY
CPC classification number: B82Y10/00 , G21K1/06 , G21K1/062 , G21K2207/005
Abstract: An analyzer that includes a first multilayer structure (350), a spacer material (354) deposited on the first multilayer structure and a second multilayer structure (356) deposited on the spacer material.
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公开(公告)号：EP1399927A4
公开(公告)日：2005-01-26
申请号：EP02746779
申请日：2002-06-27
Applicant: OSMIC INC
Inventor： MARTYNOV VLADIMIR V , PLATONOV YURIY
CPC classification number: B82Y10/00 , G02B5/1809 , G02B5/1838 , G21K1/06 , G21K1/062
Abstract: An analyzing system (10) comprised of a radiation source (12) that provides a beam (14) of radiation of various wavelengths in the range of 0.3 to 1.0 nm, a sample (16) receives and reflects the incident beam through a slit (19) to a grating (20), a grating (20) that reflects only the zero order of the beam (22), and a detector (24) that detects only the zero order. The grating (20) includes a multi-layer structure (26) that has alternating layers of materials, a plurality of grooves (30) formed between a plurality of lands (32), wherein at least one structural parameter of the plurality of grooves and plurality of lands is formed randomly in the multi-layer structure.
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