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公开(公告)号:US20250109934A1
公开(公告)日:2025-04-03
申请号:US18477158
申请日:2023-09-28
Applicant: Orbotech Ltd.
Inventor: Yuri Paskover , Hanina Golan , Ilia Lutsker , Nir Turko , Oleg Yermak , Saki Hakim
Abstract: In the system, an illumination source emits light, a first beam splitter directs a portion of the light toward a sample and directs another portion of the light toward a reference surface that reflects the light back to the first beam splitter to be recombined with light reflected by the sample, at least one second beam splitter that directs n portions of the light toward n detectors, each of the n portions of the light having a preset phase shift and n≥2, and a processor receives intensities of the n portions of the light. The processor calculates an interferogram envelope based on the intensities measured by the n detectors as the reference surface moves between a plurality of signal collection positions.