2.
    发明专利
    未知

    公开(公告)号:DE60226111T2

    公开(公告)日:2009-05-28

    申请号:DE60226111

    申请日:2002-02-26

    Applicant: PANASONIC CORP

    Abstract: A dielectric filter includes resonator electrodes, an inter-stage coupling capacitor electrode, and an input/output coupling capacitor electrode on dielectric substrates, respectively. The resonator electrodes are electro-magnetically coupled to each other to form a tri-plate structure, are made of a metallic foil embedded in a resonator dielectric substrate. Another dielectric filter includes an upper shield electrode dielectric substrate, an inter-stage coupling capacitor dielectric substrate, a resonator dielectric substrate, and an input/output coupling capacitor dielectric substrate which are made of a composite dielectric material including a high-dielectric-constant material and a low-dielectric-constant material. The above described arrangement provides the dielectric filter with an improved Q factor of a resonator, a low loss, and a high attenuation.

    Current detection probe, current measuring apparatus and current detection device
    3.
    发明专利
    Current detection probe, current measuring apparatus and current detection device 审中-公开
    电流检测探头,电流测量装置和电流检测装置

    公开(公告)号:JP2011226804A

    公开(公告)日:2011-11-10

    申请号:JP2010094155

    申请日:2010-04-15

    Abstract: PROBLEM TO BE SOLVED: To provide a novel probe that can be used for direct current detection in a non-contact state.SOLUTION: A current detection probe 100 includes a first coil 101 that is wired annularly along the xy plane defined by the x direction and y direction, a second coil 102 that is connected with the first coil 101 and wired annularly along the xy plane at a position separated from the first coil 101 in the y direction and has an opposite winding direction to the first coil 101, a third coil 103 that is wired annularly along the zx plane defined by the z direction and the x direction, and a fourth coil 104 that is connected with the third coil 103 and wired annularly along the zx plane at a position separated from the third coil 103 in the z direction and has an opposite winding direction to the third coil 101.

    Abstract translation: 要解决的问题:提供可用于非接触状态的直流检测的新型探针。 解决方案:电流检测探头100包括沿着由x方向和y方向限定的xy平面环形布线的第一线圈101,与第一线圈101连接并沿xy方向环状连接的第二线圈102 在与第一线圈101在y方向分离的位置上具有与第一线圈101相反的卷绕方向的第三线圈103,沿着由z方向和x方向限定的zx平面线圈地连接的第三线圈103, 第四线圈104,其与第三线圈103连接,并且沿着zx平面在与z方向分离的第三线圈103的位置处环形连接并且具有与第三线圈101相反的卷绕方向。版权所有(C) )2012,JPO&INPIT

    Design support device
    4.
    发明专利
    Design support device 审中-公开
    设计支持设备

    公开(公告)号:JP2009251856A

    公开(公告)日:2009-10-29

    申请号:JP2008097908

    申请日:2008-04-04

    Abstract: PROBLEM TO BE SOLVED: To solve the problem that a development read time is widely lengthened due to countermeasures to an unwanted radiation noise since it is difficult to predict any influence of the unwanted radiation noise on the operation of electronic equipment. SOLUTION: This design support device 100 includes: an operation environment extraction part 120 for extracting an operation environment affecting the communication of an antenna 301 from among a plurality of operation environment of the electronic component 310; and a correlation value calculation part 160 for calculating a correlation value showing the degree of an influence of an electromagnetic field to be generated by the electronic component 310 on the electronic equipment based on the intensity distribution of the electromagnetic field of the electronic component 310 and the intensity distribution of the electromagnetic field of the antenna 301. Then, the correlation value calculation part 160 calculates a correlation value showing the degree of influence of the electronic component 310 on the electronic equipment about an operation environment extracted by the operation environment extraction part 120. Thus, it is possible to shorten the processing in the correlation value calculation part 160, and to simplify the processing of the design support device 100. COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题:为了解决由于难以预测不期望的辐射噪声对电子设备的操作的任何影响而由于对不期望的辐射噪声的对策而广泛地延长开发读取时间的问题。 解决方案:该设计支持设备100包括:操作环境提取部分120,用于从电子组件310的多个操作环境中提取影响天线301的通信的操作环境; 以及相关值计算部160,用于基于电子部件310的电磁场的强度分布和电子部件310的强度分布,计算表示电子部件310对电子设备产生的电磁场的影响程度的相关值 然后,相关值计算部160计算表示电子设备对电子设备的影响程度的关于由操作环境提取部120提取的操作环境的影响程度的相关值。 因此,可以缩短相关值计算部160中的处理,并且简化设计支持装置100的处理。版权所有(C)2010,JPO&INPIT

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