公开(公告)号：DE60220543T2

公开(公告)日：2008-02-07

申请号：DE60220543

申请日：2002-12-17

Applicant: PHILIPS INTELLECTUAL PROPERTY

Inventor： GREUEL GEORG ,  KLEIN MARKUS H ,  VAN DE WEIJER PETER ,  JACOBS BOUDEWIJN J ,  GEURTS JOEP

IPC: G01R33/561 ,  H05B33/10 ,  G02F1/1343 ,  G02F1/135 ,  G09F9/00 ,  G09G3/20 ,  G09G3/3216 ,  G09G3/3225 ,  G09G3/3266 ,  G09G3/3275 ,  H01L51/50 ,  H05B33/14

Abstract: A method of healing low-ohmic defects in a flat display is characterized by passing an extra current during a pre-determined time period through the affected subarea of the flat display, said current being selected to turn at least one defect or a specific surrounding of at least one defect into a high-ohmic state which has a resistance higher than the initial resistance of said at least one defect.

公开(公告)号：DE60220543D1

公开(公告)日：2007-07-19

申请号：DE60220543

申请日：2002-12-17

Applicant: PHILIPS INTELLECTUAL PROPERTY

Inventor： GREUEL GEORG ,  KLEIN MARKUS H ,  VAN DE WEIJER PETER ,  JACOBS BOUDEWIJN J ,  GEURTS JOEP

IPC: G01R33/561 ,  H05B33/10 ,  G02F1/1343 ,  G02F1/135 ,  G09F9/00 ,  G09G3/20 ,  G09G3/3216 ,  G09G3/3225 ,  G09G3/3266 ,  G09G3/3275 ,  H01L51/50 ,  H05B33/14

Abstract: A method of healing low-ohmic defects in a flat display is characterized by passing an extra current during a pre-determined time period through the affected subarea of the flat display, said current being selected to turn at least one defect or a specific surrounding of at least one defect into a high-ohmic state which has a resistance higher than the initial resistance of said at least one defect.