IMPROVED SAMPLE CELL FOR ONE GAS EMISSION SPECTRAL ANALYSIS

    公开(公告)号:JPH11326219A

    公开(公告)日:1999-11-26

    申请号:JP5684599

    申请日:1999-03-04

    Abstract: PROBLEM TO BE SOLVED: To obtain improved analysis pipe and method for detecting a number of selected impurities in the gas flow of a mixed gas under continuous gas flow conditions. SOLUTION: A discharge pipe 10 is improved for use in a gas discharge spectrometer for analyzing and measuring a plurality of low-concentration gas/vapour impurities in a gas flow, has a plurality of analysis points 16, 18, 20, and 22, and analyzes and measures emission radiation being generated by an AC power supply across sample cells 24 and 26 through them.

    4.
    发明专利
    未知

    公开(公告)号:ID22720A

    公开(公告)日:1999-12-09

    申请号:ID990116

    申请日:1999-02-15

    Abstract: An electric discharge tube for a gas emission spectrometer and method for analyzing and measuring low concentration levels of multiple gas/vapor impurities in a gas stream under continuous flow conditions. The electric discharge tube comprises a plurality of analytical sites through which emissive radiation generated by an alternating source of power across the tube can be analyzed and measured.

    5.
    发明专利
    未知

    公开(公告)号:BR9900883A

    公开(公告)日:1999-12-14

    申请号:BR9900883

    申请日:1999-03-04

    Abstract: An electric discharge tube for a gas emission spectrometer and method for analyzing and measuring low concentration levels of multiple gas/vapor impurities in a gas stream under continuous flow conditions. The electric discharge tube comprises a plurality of analytical sites through which emissive radiation generated by an alternating source of power across the tube can be analyzed and measured.

    EMISSION SPECTROMETER HAVING CHARGE COUPLED DEVICE DETECTOR
    6.
    发明申请
    EMISSION SPECTROMETER HAVING CHARGE COUPLED DEVICE DETECTOR 审中-公开
    具有充电耦合器件检测器的发射光谱仪

    公开(公告)号:WO03004981A9

    公开(公告)日:2005-03-17

    申请号:PCT/US0220775

    申请日:2002-07-01

    CPC classification number: G01J3/2803 G01J3/443

    Abstract: An analyzer suitable for performing continuous gas analysis in ultra-high purity applications. The analyser combines a low-level emission source and a gaseous emission spectrometer (10) having a charge coupled device (CCD) diode array as a detector. The CCD detector replaces one or more photomultipliers and narrow bandpass filters typically used in spectrometers. The analyser performs various processing operations to evaluate and eliminate the effect of background light level, or dark spectrum.

    Abstract translation: 适用于在超高纯度应用中进行连续气体分析的分析仪。 分析仪结合了低电平发射源和具有电荷耦合器件(CCD)二极管阵列的气体发射光谱仪(10)作为检测器。 CCD检测器代替通常用于光谱仪中的一个或多个光电倍增管和窄带通滤波器。 分析仪执行各种处理操作,以评估和消除背景光等级或暗光谱的影响。

    EMISSION SPECTROMETER HAVING CHARGE COUPLED DEVICE DETECTOR
    8.
    发明申请
    EMISSION SPECTROMETER HAVING CHARGE COUPLED DEVICE DETECTOR 审中-公开
    具有充电耦合器件检测器的发射光谱仪

    公开(公告)号:WO03004981A8

    公开(公告)日:2004-04-08

    申请号:PCT/US0220775

    申请日:2002-07-01

    CPC classification number: G01J3/2803 G01J3/443

    Abstract: An analyzer suitable for performing continuous gas analysis in ultra-high purity applications. The analyser combines a low-level emission source and a gaseous emission spectrometer (10) having a charge coupled device (CCD) diode array as a detector. The CCD detector replaces one or more photomultipliers and narrow bandpass filters typically used in spectrometers. The analyser performs various processing operations to evaluate and eliminate the effect of background light level, or dark spectrum.

    Abstract translation: 适用于在超高纯度应用中进行连续气体分析的分析仪。 分析仪结合了低电平发射源和具有电荷耦合器件(CCD)二极管阵列的气体发射光谱仪(10)作为检测器。 CCD检测器代替通常用于光谱仪中的一个或多个光电倍增管和窄带通滤波器。 分析仪执行各种处理操作,以评估和消除背景光等级或暗光谱的影响。

    EMISSION SPECTROMETER HAVING CHARGE COUPLED DEVICE DETECTOR
    9.
    发明申请
    EMISSION SPECTROMETER HAVING CHARGE COUPLED DEVICE DETECTOR 审中-公开
    具有充电耦合器件检测器的发射光谱仪

    公开(公告)号:WO03004981A2

    公开(公告)日:2003-01-16

    申请号:PCT/US0220775

    申请日:2002-07-01

    CPC classification number: G01J3/2803 G01J3/443

    Abstract: An analyzer suitable for performing continuous gas analysis in ultra-high purity applications. The analyser combines a low-level emission source and a gaseous emission spectrometer (10) having a charge coupled device (CCD) diode array as a detector. The CCD detector replaces one or more photomultipliers and narrow bandpass filters typically used in spectrometers. The analyser performs various processing operations to evaluate and eliminate the effect of background light level, or dark spectrum.

    Abstract translation: 适用于在超高纯度应用中进行连续气体分析的分析仪。 分析仪结合了低电平发射源和具有电荷耦合器件(CCD)二极管阵列的气体发射光谱仪(10)作为检测器。 CCD检测器代替通常用于光谱仪中的一个或多个光电倍增管和窄带通滤波器。 分析仪执行各种处理操作,以评估和消除背景光等级或暗光谱的影响。

Patent Agency Ranking