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    REFLECTION REFUTING LASER SCANNER
    1.
    发明公开
    REFLECTION REFUTING LASER SCANNER 审中-公开

    公开(公告)号：US20230403475A1

    公开(公告)日：2023-12-14

    申请号：US18331604

    申请日：2023-08-29

    Applicant: Path Robotics, Inc.

    Inventor： William HUANG ,  Animesh DHAGAT ,  Tarushree GANDHI ,  Jason ROBINSON ,  Alexander James LONSBERRY

    IPC: H04N23/75 ,  H04N23/56 ,  H04N23/71 ,  G01S17/89 ,  G01S7/481

    CPC classification number: H04N23/75 ,  H04N23/56 ,  H04N23/71 ,  G01S17/89 ,  G01S7/4814

    Abstract: This disclosure provides systems, methods, and apparatuses, including computer programs encoded on computer storage media, that provide for optical techniques for manufacturing robots, such as for filtering certain reflections when scanning an object. For example, the techniques may include receiving, from a detector, sensor data based on detected light, the detected light including reflections of light projected by one or more emitters and reflected off of an object. The techniques may further include determining, based on the sensor data, a first-order reflection and a second-order reflection. The techniques may also include determining, based on the first-order reflection and a second-order reflection, a difference, the difference includes a polarity difference, an intensity difference, or a combination thereof. The techniques may include filtering the second-order reflection based on the difference Other aspects and features are also claimed and described.

    REFLECTION REFUTING LASER SCANNER
    2.
    发明申请
    REFLECTION REFUTING LASER SCANNER 审中-公开

    公开(公告)号：US20200240772A1

    公开(公告)日：2020-07-30

    申请号：US16778649

    申请日：2020-01-31

    Applicant: Path Robotics, Inc.

    Inventor： Alexander James LONSBERRY ,  Andrew Gordon LONSBERRY

    IPC: G01B11/25

    Abstract: Some embodiments described herein relate to optical systems and methods for determining the shape and/or size of objects that include projecting a pattern of light onto the object. The pattern of light can be configured such that first-order reflections can be distinguished from second- and/or higher-order reflections, which can be rejected. Thus, even in instances in which the pattern of light is reflected onto the object multiple times, the original, or first-order, reflection can be detected, distinguished, and/or used for laser triangulation. In some embodiments, a pattern of light that does not have reflection and/or rotational symmetry is projected onto the object, such that second-order and/or higher-order reflections can be distinguished from the first-order reflection.

    TECHNIQUES FOR SEAM LOCALIZATION AND GAP MEASUREMENT
    3.
    发明申请
    TECHNIQUES FOR SEAM LOCALIZATION AND GAP MEASUREMENT 有权

    公开(公告)号：US20250153261A1

    公开(公告)日：2025-05-15

    申请号：US18506113

    申请日：2023-11-09

    Applicant: Path Robotics, Inc.

    Inventor： Madhavun Candadai VASU ,  Siqi HUANG ,  Amrish BASKARAN ,  Colin BUNKER ,  Alexander James LONSBERRY

    IPC: B23K9/095 ,  B25J9/16 ,  B25J11/00 ,  B25J19/02 ,  G06F30/10 ,  G06T7/00 ,  G06T7/70 ,  G06V10/141

    Abstract: This disclosure provides systems, methods, and apparatuses, including computer programs encoded on computer storage media, which provide for welding techniques for manufacturing robots, such as seam localization, gap measurement, or both. For example, the welding techniques may include, during illumination of one or more objects by a light source, controlling a camera to capture images of the one or more objects along at least a portion of a length of a seam formed by the one or more objects. The techniques further include differentiating, in the images, the seam from the one or more objects. In a first aspect, the techniques also include triangulating the differentiated seam to identify a position of the seam relative to a reference point. In a second aspect, the techniques also include determining, based on the differentiated seam, gap information along a portion of the seam. Other aspects and features are also claimed and described.

    REFLECTION REFUTING LASER SCANNER
    7.
    发明申请
    REFLECTION REFUTING LASER SCANNER 审中-公开

    公开(公告)号：US20190331480A1

    公开(公告)日：2019-10-31

    申请号：US16397428

    申请日：2019-04-29

    Applicant: Path Robotics, Inc.

    Inventor： Alexander James LONSBERRY ,  Andrew Gordon LONSBERRY

    IPC: G01B11/25

    Abstract: Some embodiments described herein relate to optical systems and methods for determining the shape and/or size of objects that include projecting a pattern of light onto the object. The pattern of light can be configured such that first-order reflections can be distinguished from second- and/or higher-order reflections, which can be rejected. Thus, even in instances in which the pattern of light is reflected onto the object multiple times, the original, or first-order, reflection can be detected, distinguished, and/or used for laser triangulation. In some embodiments, a pattern of light that does not have reflection and/or rotational symmetry is projected onto the object, such that second-order and/or higher-order reflections can be distinguished from the first-order reflection.

    REFLECTION REFUTING LASER SCANNER
    9.
    发明公开
    REFLECTION REFUTING LASER SCANNER 审中-公开

    公开(公告)号：US20240230319A9

    公开(公告)日：2024-07-11

    申请号：US18494497

    申请日：2023-10-25

    Applicant: Path Robotics, Inc.

    Inventor： Alexander James LONSBERRY ,  Andrew Gordon LONSBERRY

    IPC: G01B11/25

    CPC classification number: G01B11/2513 ,  G01B11/2518

    Abstract: Some embodiments described herein relate to optical systems and methods for determining the shape and/or size of objects that include projecting a pattern of light onto the object. The pattern of light can be configured such that first-order reflections can be distinguished from second- and/or higher-order reflections, which can be rejected. Thus, even in instances in which the pattern of light is reflected onto the object multiple times, the original, or first-order, reflection can be detected, distinguished, and/or used for laser triangulation. In some embodiments, a pattern of light that does not have reflection and/or rotational symmetry is projected onto the object, such that second-order and/or higher-order reflections can be distinguished from the first-order reflection.

    REFLECTION REFUTING LASER SCANNER
    10.
    发明公开
    REFLECTION REFUTING LASER SCANNER 审中-公开

    公开(公告)号：US20240133678A1

    公开(公告)日：2024-04-25

    申请号：US18494497

    申请日：2023-10-24

    Applicant: Path Robotics, Inc.

    Inventor： Alexander James LONSBERRY ,  Andrew Gordon LONSBERRY

    IPC: G01B11/25

    CPC classification number: G01B11/2513 ,  G01B11/2518

    Abstract: Some embodiments described herein relate to optical systems and methods for determining the shape and/or size of objects that include projecting a pattern of light onto the object. The pattern of light can be configured such that first-order reflections can be distinguished from second- and/or higher-order reflections, which can be rejected. Thus, even in instances in which the pattern of light is reflected onto the object multiple times, the original, or first-order, reflection can be detected, distinguished, and/or used for laser triangulation. In some embodiments, a pattern of light that does not have reflection and/or rotational symmetry is projected onto the object, such that second-order and/or higher-order reflections can be distinguished from the first-order reflection.

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