公开(公告)号：WO2017052744A2

公开(公告)日：2017-03-30

申请号：PCT/US2016/043758

申请日：2016-07-22

Applicant: RAYTHEON COMPANY

Inventor： MARTIN, Chadwick B. ,  KREMER, Rex M. ,  TEMKIN, Jesse C.

IPC: G01J5/04 ,  G01J5/06 ,  G01N21/94

CPC classification number: G01J5/043 ,  G01J5/044 ,  G01J5/061 ,  G01J5/522 ,  G01J2005/066 ,  G01N21/94 ,  G01N2021/157

Abstract: A detector assembly (300, 500) includes a dewar chamber (102, 502) having an aperture (108, 510) and an infrared radiation detector (106, 514). The detector assembly also includes a mirror (304, 400, 410, 504) disposed adjacent the aperture of the dewar chamber, where the mirror has a reflective surface (306, 604) and an emitting region (305, 402, 412, 606) facing the aperture. The infrared radiation detector is configured to detect first radiation and second radiation from the mirror. The first radiation originates from at least one relatively cold surface in the dewar chamber and reflects off the reflective surface of the mirror. The second warm radiation originates from at least one relatively warm surface at or behind the emitting region. The infrared radiation detector is also configured to detect an artifact (122, 712, 722, 802) caused by a particle (110) in the dewar chamber that blocks a portion of the first or second radiation.

Abstract translation: 检测器组件（300,500）包括具有孔径（108,510）和红外辐射探测器（106,514）的杜瓦瓶室（102,502）。 检测器组件还包括邻近杜瓦瓶室的孔设置的反射镜（304,400,410,504），其中反射镜具有反射表面（306,604）和发射区域（305,402,412,606） 面对光圈。 红外辐射检测器被配置为检测来自反射镜的第一辐射和第二辐射。 第一辐射源自杜瓦瓶室中的至少一个相对较冷的表面并且反射离开反射镜的反射表面。 第二暖辐射源自发射区域之上或之后的至少一个相对温暖的表面。 红外辐射检测器还被配置为检测由杜瓦瓶室中的颗粒（110）引起的伪影（122,712,722,802），其阻挡第一或第二辐射的一部分。

公开(公告)号：EP3353513A2

公开(公告)日：2018-08-01

申请号：EP16819709.3

申请日：2016-07-22

Applicant: Raytheon Company

Inventor： MARTIN, Chadwick B. ,  KREMER, Rex M. ,  TEMKIN, Jesse C.

IPC: G01J5/04 ,  G01J5/06 ,  G01N21/94

CPC classification number: G01J5/043 ,  G01J5/044 ,  G01J5/061 ,  G01J5/522 ,  G01J2005/066 ,  G01N21/94 ,  G01N2021/157

Abstract: A detector assembly includes a dewar chamber having an aperture and an infrared radiation detector. The detector assembly also includes a mirror disposed adjacent the aperture of the dewar chamber, where the mirror has a reflective surface and an emitting region facing the aperture. The infrared radiation detector is configured to detect first radiation and second radiation from the mirror. The first radiation originates from at least one relatively cold surface in the dewar chamber and reflects off the reflective surface of the mirror. The second warm radiation originates from at least one relatively warm surface at or behind the emitting region. The infrared radiation detector is also configured to detect an artifact caused by a particle in the dewar chamber that blocks a portion of the first or second radiation.