辐射体温计
    2.
    发明授权

    公开(公告)号:CN1195446C

    公开(公告)日:2005-04-06

    申请号:CN97191684.5

    申请日:1997-10-31

    Inventor: 柄川俊二

    Abstract: 一种辐射体温计包括:导光管,以引导来自测温对象的红外线辐射;第一红外线传感器,以检测来自导光管的红外线辐射;感温传感器,它产生基准温度信号;基准腔,它有与导光管大致相同的温度条件,且被密封以遮断来自外侧的红外线辐射;第二红外线传感器,以检测来自基准腔的红外线辐射;温度计算装置,以根据来自第一红外线传感器、第二红外线传感器、以及感温传感器的信号来计算温度值;以及显示装置,用根据来自温度计算装置的信号显示温度值;至少是导光管或基准腔从第一或第二红外线传感器侧朝导光管辐射入口逐渐变细。

    辐射体温计
    3.
    发明公开

    公开(公告)号:CN1208334A

    公开(公告)日:1999-02-17

    申请号:CN97191684.5

    申请日:1997-10-31

    Inventor: 柄川俊二

    Abstract: 一种辐射体温计包括:导光管,以引导来自测温对象的红外线辐射;第一红外线传感器,以检测来自导光管的红外线辐射;感温传感器,它产生基准温度信号;基准腔,它有与导光管大致相同的温度条件,且被密封以遮断来自外侧的红外线辐射;第二红外线传感器,以检测来自基准腔的红外线辐射;温度计算装置,以根据来自第一红外线传感器、第二红外线传感器、以及感温传感器的信号来计算温度值;以及显示装置,用根据来自温度计算装置的信号显示温度值;至少是导光管或基准腔从第一或第二红外线传感器侧朝导光管辐射入口逐渐变细。

    DEVICE AND METHOD FOR HEATING OBJECTS WHEREIN THE TEMPERATURE OF THE OBJECT IS MEASURED
    10.
    发明申请
    DEVICE AND METHOD FOR HEATING OBJECTS WHEREIN THE TEMPERATURE OF THE OBJECT IS MEASURED 审中-公开
    用于加热对象温度的物体的装置和方法被测量

    公开(公告)号:WO1994000744A1

    公开(公告)日:1994-01-06

    申请号:PCT/EP1993001702

    申请日:1993-06-29

    Abstract: Device for heating an object, in particular a wafer of semiconductor material, comprising: a chamber (2) in which the object for heating can be placed and which is provided with a wall permeable to radiation in a determined wavelength range; heating elements (3) for heating the object in the chamber; first radiating elements (5) for projecting radiation onto the object; means for modulating the intensity of the radiation coming from the first radiating elements; a radiation meter (6) for measuring the radiation intensity generated by the object, the sensitivity of which is located for a significant part in said wavelength range; and filtering means (4) for filtering in said wavelength range radiation coming from the heating means and/or parts heated by the heating means, wherein the filtering means are disposed such that radiation from the modulated first radiating elements reaches the radiation meter unfiltered.

    Abstract translation: 用于加热物体,特别是半导体材料的晶片的装置,包括:室(2),其中可以放置加热物体,并且其中设置有可透过确定波长范围的辐射的壁; 用于加热室中物体的加热元件(3) 用于将辐射投射到物体上的第一辐射元件(5) 用于调制来自第一辐射元件的辐射的强度的装置; 用于测量由所述物体产生的辐射强度的辐射计(6),其灵敏度位于所述波长范围中的很大部分; 以及用于在所述波长范围内过滤来自加热装置的辐射和/或由加热装置加热的部件的滤波装置(4),其中滤波装置被布置成使得来自调制的第一辐射元件的辐射到达未过滤的辐射计。

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