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公开(公告)号:US3039185A
公开(公告)日:1962-06-19
申请号:US67369057
申请日:1957-07-23
Applicant: RCA CORP
Inventor: OATES WILLIAM L
IPC: B23K3/06
CPC classification number: B23K3/0653 , B23K2201/42
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2.Microminiature electrical component having integral indexing means 失效
Title translation: 具有整体指标的微电子元件公开(公告)号:US3521128A
公开(公告)日:1970-07-21
申请号:US3521128D
申请日:1967-08-02
Applicant: RCA CORP
Inventor: OATES WILLIAM L
CPC classification number: H01L21/67144 , H01L23/36 , H01L23/485 , H01L24/81 , H01L2224/13022 , H01L2224/81801 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01019 , H01L2924/01029 , H01L2924/01033 , H01L2924/01043 , H01L2924/0105 , H01L2924/01074 , H01L2924/01075 , H01L2924/01082 , H01L2924/01084 , H01L2924/01322 , H01L2924/014 , H01L2924/10157 , H01L2924/14 , Y10T29/41
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公开(公告)号:US3263303A
公开(公告)日:1966-08-02
申请号:US18616162
申请日:1962-04-09
Applicant: RCA CORP
Inventor: OATES WILLIAM L
IPC: H05K1/14
CPC classification number: H05K1/144 , Y10T29/49172 , Y10T29/4981
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4.Probe assembly for testing semiconductor wafers including a wafer vibrator for effecting good test connections 失效
Title translation: 用于测试半导体波形的探头组件,包括用于影响良好测试连接的波形振动器公开(公告)号:US3453545A
公开(公告)日:1969-07-01
申请号:US3453545D
申请日:1967-07-07
Applicant: RCA CORP
Inventor: OATES WILLIAM L
CPC classification number: G01R1/07342
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公开(公告)号:US3324826A
公开(公告)日:1967-06-13
申请号:US25316163
申请日:1963-01-22
Applicant: RCA CORP
Inventor: OATES WILLIAM L
CPC classification number: B05C1/025 , B05C7/00 , H05K1/092 , H05K3/403 , H05K3/4061 , H05K2201/09181 , H05K2203/0195 , H05K2203/0338
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公开(公告)号:CA911615A
公开(公告)日:1972-10-03
申请号:CA911615D
Applicant: RCA CORP
Inventor: OATES WILLIAM L
IPC: H01L23/42 , H01L23/473 , H01L25/03 , H01L25/16
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