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公开(公告)号:FI91575C
公开(公告)日:1994-07-11
申请号:FI875296
申请日:1987-12-01
Applicant: RCA CORP
Inventor: FURST DAVID ARTHUR , VIELAND LEON JOSEPH
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公开(公告)号:FI875296A
公开(公告)日:1988-06-09
申请号:FI875296
申请日:1987-12-01
Applicant: RCA CORP
Inventor: FURST DAVID ARTHUR , VIELAND LEON JOSEPH
Abstract: A MIM diode (10) has an insulator (14) with a maximum thickness of 80 nm and comprising a mixture of tantalum oxide and another oxide, such as aluminum oxide or silicon oxide. The mixture has a lower leakage current and higher non-linearity than an insulator comprising pure tantalum oxide. The other oxide can be between about 10-70 average mole percent of the insulator. The minimum thickness can be about 35 nm to prevent pinholes.
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公开(公告)号:FR2505090A1
公开(公告)日:1982-11-05
申请号:FR8207319
申请日:1982-04-28
Applicant: RCA CORP
Inventor: CANNULI VINCENT MICHAEL , VIELAND LEON JOSEPH
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公开(公告)号:DE3102183A1
公开(公告)日:1981-12-03
申请号:DE3102183
申请日:1981-01-23
Applicant: RCA CORP
Inventor: VIELAND LEON JOSEPH , CANNULI VINCENT MICHAEL
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公开(公告)号:MX5032E
公开(公告)日:1983-02-22
申请号:MX10095580
申请日:1980-08-01
Applicant: RCA CORP
Inventor: BORTFELD DAVID PAUL , VIELAND LEON JOSEPH
IPC: H01J3/18
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公开(公告)号:FR2474239A1
公开(公告)日:1981-07-24
申请号:FR8101024
申请日:1981-01-21
Applicant: RCA CORP
Inventor: VIELAND LEON JOSEPH , CANNULI VINCENT MICHAEL
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公开(公告)号:DE3032487A1
公开(公告)日:1981-03-12
申请号:DE3032487
申请日:1980-08-28
Applicant: RCA CORP
Inventor: VIELAND LEON JOSEPH , BORTFELD DAVID PAUL
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公开(公告)号:FI802647A
公开(公告)日:1981-03-01
申请号:FI802647
申请日:1980-08-21
Applicant: RCA CORP
Inventor: BORTFELD DAVID PAUL , VIELAND LEON JOSEPH
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公开(公告)号:IT8119097D0
公开(公告)日:1981-01-12
申请号:IT1909781
申请日:1981-01-12
Applicant: RCA CORP
Inventor: VIELAND LEON JOSEPH , CANNULI VINCENT MICHAEL
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公开(公告)号:FI91575B
公开(公告)日:1994-03-31
申请号:FI875296
申请日:1987-12-01
Applicant: RCA CORP
Inventor: FURST DAVID ARTHUR , VIELAND LEON JOSEPH
Abstract: A MIM diode (10) has an insulator (14) with a maximum thickness of 80 nm and comprising a mixture of tantalum oxide and another oxide, such as aluminum oxide or silicon oxide. The mixture has a lower leakage current and higher non-linearity than an insulator comprising pure tantalum oxide. The other oxide can be between about 10-70 average mole percent of the insulator. The minimum thickness can be about 35 nm to prevent pinholes.
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