Abstract:
The present invention relates to a sensor kit (1) for detecting an analyte. It comprises x indicator substances (S 1 , S 2 ... S x ) having a specific spectral response to the analyte, whereby 1 1 , r 2 ...r n ) arranged adjacent to a second side (4). Each indicator substance region is arranged for carrying one indicator substance and the substrate comprises at least one indicator substance region for each indicator substance. A filter element (5) is integrated with the substrate, which comprises at least one of each of n different filters (f 1 , f 2 - - -f n ), whereby 2
Abstract translation:本发明涉及一种用于检测分析物的传感器套件(1)。 它包含对分析物具有特定光谱响应的x指示剂物质(S 1,S 2,S 2,X 2) X <200。 传感器套件还包括要在第一侧(3)上照明的衬底(2),并且包括至少一个指示物质区域(r 1 SUB,r 2 邻近第二侧面(4)布置。 每个指示物质区域被布置用于携带一个指示物质,并且该基底包括用于每个指示物质的至少一个指示物质区域。 过滤元件(5)与衬底集成,其包括n个不同过滤器(f 1,...,F 2)中的每一个中的至少一个, n <2),由此2
Abstract:
A method for measuring a property of a test sample utilizing one of the test methods ellipsometry, surface plasmon resonance and nephelometry, wherein the method includes the steps; providing a test sample being an object with which an optical interaction with light takes place, illuminating said test sample using a program controlled display as a light source, which program controlled display is composed of at least one activated pixel providing an illumination from an illuminating area of said program controlled display, arranging said program controlled display to illuminate said test sample with polarized light, detecting light emerging from said test sample utilizing a detector coupled to said program and evaluating said property from signals from said detector.
Abstract:
The present invention relates to a sensor kit (1) for detecting an analyte. It comprises x indicator substances (S1, S2... Sx) having a specific spectral response to the analyte, whereby 1