PROBE MARK INSPECTION
    1.
    发明专利

    公开(公告)号:SG193874A1

    公开(公告)日:2013-10-30

    申请号:SG2013067939

    申请日:2009-09-10

    Abstract: Abstract PROBE MARK INSPECTIONProbe mark inspection involves a recipe based on unique image characteristics or combinations of unique image characteristics. Result images are correlated with a reference created to determine which image characteristic or combination of image characteristics provides an improved contrast.Figure 5b

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