Abstract:
A scintillator device includes an optically clear substrate, a scintillator plastic layer overlying the optically clear substrate, and an optically clear polymer layer between the optically clear substrate and the scintillator plastic layer. The optically clear polymer layer can mechanically and optically couple the scintillator plastic layer to the optically clear substrate. Further, the clear polymer layer can be configured to substantially reduce the formation of cracks in the scintillator plastic layer due to thermal expansion, thermal contraction, or a combination thereof, of the scintillator device.
Abstract:
A scintillator device includes an optically clear substrate, a scintillator plastic layer overlying the optically clear substrate, and an optically clear polymer layer between the optically clear substrate and the scintillator plastic layer. The optically clear polymer layer can mechanically and optically couple the scintillator plastic layer to the optically clear substrate. Further, the clear polymer layer can be configured to substantially reduce the formation of cracks in the scintillator plastic layer due to thermal expansion, thermal contraction, or a combination thereof, of the scintillator device.
Abstract:
A detector made of a detector assembly including a detector housing comprising a reflective interior surface relative to a wavelength of fluoresced electromagnetic radiation, and a scintillator contained within the detector housing. The detector further including a photomultiplier tube (PMT) coupled to the detector housing, wherein a portion of the PMT is contained within the detector housing.
Abstract:
A rare-earth halide material comprising a first surface region having a first surface roughness (Rrms1) and a second surface region having a second surface roughness (Rrms2), wherein the first surface roughness value is at least about 10% less than the second surface roughness value, wherein surface roughness is measured using scanning white light interferometry over an area of 1 mm2.
Abstract:
A rare-earth halide material comprising a first surface region having a first surface roughness (Rrms1) and a second surface region having a second surface roughness (Rrms2), wherein the first surface roughness value is at least about 10% less than the second surface roughness value, wherein surface roughness is measured using scanning white light interferometry over an area of 1 mm2.