公开(公告)号：JP2001349780A

公开(公告)日：2001-12-21

申请号：JP2000173853

申请日：2000-06-09

Applicant: SEIKO INSTR INC

Inventor： NAKANO NOBUO ,  HARADA YOICHI ,  TAKAGI YASUYUKI ,  KIHARA HIROYUKI ,  MATSUDA TAKAKIMI

IPC: G01J3/06 ,  G01J3/18 ,  G01N21/73

Abstract: PROBLEM TO BE SOLVED: To achieve less wear in a rotating mechanism for a diffraction grating of a spectrograph for an inductive coupling plasma spectrum analyzer by sliding a contact mounted at the end of a sine bar in smooth contact with a knife edge. SOLUTION: In the rotating mechanism for the diffraction grating 1 of the spectrograph for the inductive coupling plasma spectrum analyzer, the contact surface of the contact 4 with the sine bar 3 is in the form of contact at a point on a curved face.