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公开(公告)号：JPH11166896A
公开(公告)日：1999-06-22
申请号：JP33613097
申请日：1997-12-05
Applicant: SEIKO INSTR INC
Inventor： HARADA YOICHI
Abstract: PROBLEM TO BE SOLVED: To move a photometric position for a plasma by use of a simple, low-cost, fail-free device. SOLUTION: A convex lens 2 is used as an incidence optical system collecting the light of a plasma 1 to the incidence slit 31 of a spectroscope 3 and causing the light to impinge thereon. To move a photometric position for the plasma 1, the convex lens 2 is moved vertically in parallel directions. A main optical axis is tilted to enable the movement of the photometric position.
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公开(公告)号：JP2001349780A
公开(公告)日：2001-12-21
申请号：JP2000173853
申请日：2000-06-09
Applicant: SEIKO INSTR INC
Inventor： NAKANO NOBUO , HARADA YOICHI , TAKAGI YASUYUKI , KIHARA HIROYUKI , MATSUDA TAKAKIMI
Abstract: PROBLEM TO BE SOLVED: To achieve less wear in a rotating mechanism for a diffraction grating of a spectrograph for an inductive coupling plasma spectrum analyzer by sliding a contact mounted at the end of a sine bar in smooth contact with a knife edge. SOLUTION: In the rotating mechanism for the diffraction grating 1 of the spectrograph for the inductive coupling plasma spectrum analyzer, the contact surface of the contact 4 with the sine bar 3 is in the form of contact at a point on a curved face.
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公开(公告)号：JPH06229828A
公开(公告)日：1994-08-19
申请号：JP2040893
申请日：1993-02-08
Applicant: SEIKO INSTR INC
Inventor： HARADA YOICHI
Abstract: PURPOSE:To accurately calculate the angle between a dominance wavelength dispersing element (main grating) and auxiliary wavelength dispersing element (auxiliary grating) from the interval of diffracted light by fixing both elements at an angle. CONSTITUTION:An auxiliary grating 5 is fixed to a main grating 6 at an angle of about 45 deg. around a driving shaft against the grating 6. When such a constitution is used, diffracted light of each order generated by spectroscopically separating the light of a light source 1 through the auxiliary grating 5 becomes almost 7 constant at short intervals even when the light of another light source 2 for spectroscope is separated within a range of angles of diffraction from 0 deg. to 90 deg. through the main grating 6. A control section 12 then discriminates whether or not the diffracted light made incident to an auxiliary detector 9 from the grating 5 is composed of a plurality of light rays. When the diffracted light is composed of a plurality of light rays, the section 12 calculates the angle of the grating 5 against the grating 6 by calculating the angle of the diffracted light rays from their intervals and angle of an emitting slit 8 against a virtual position. In case the diffracted light is single, the section 12 stores the driving angle until a plurality of diffracted light rays are made incident and, when the plurality of diffracted light rays is made incident, performs similar calculation.
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公开(公告)号：JPH05340816A
公开(公告)日：1993-12-24
申请号：JP14751992
申请日：1992-06-08
Applicant: SEIKO INSTR INC
Inventor： HARADA YOICHI
Abstract: PURPOSE:To reduce the measuring time of a spectroscopic measuring instrument by making the instrument to perform integrating operations at different integrating time and using the largest one of the integrated values smaller than saturated integrated values as an integrated value. CONSTITUTION:The light spectroscopically separated in a spectroscope 1 forms an image in a one-dimensional photodetector 2 provided on the wavelength dispersing surface of the spectroscope 1. A plurality of light detecting elements are arranged on the photodetector 2. A control circuit 3 first makes the photodetector 2 to perform integrating operations during the period of 0.01 second only. After the integrating operations, the integrated value of each element is stored in a storage circuit 4. Then the circuit 3 makes the photodetector 2 to successively perform integrating operations during the periods of 0.1, 1, 10, 100 seconds only and the integrated values obtained by each element corresponding to the integrating periods of time are stored in the circuit 4. When all integrating operations are completed, a detection circuit 5 detects the largest integrated values among the integrated values of each element smaller than the saturated integrated value of each element measured in advance. A conversion circuit 6 converts the detected integrated values into integrated values per unit integrating period of time by using the integrating periods of time as measured values.
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公开(公告)号：JPH0862140A
公开(公告)日：1996-03-08
申请号：JP19878694
申请日：1994-08-23
Applicant: SEIKO INSTR INC
Inventor： HARADA YOICHI , ITOU TETSUMASA
IPC: G01N21/73
Abstract: PURPOSE: To obtain a method and apparatus for induction coupling plasma emission analysis in which a spectrometer can be selected depending on the concentration, properties, required sensitivity and accuracy of a sample or an element to be analyzed by a constitution wherein some of a plurality of spectrometers take in the light coming in a direction perpendicular to the generating direction of plasma and other spectrometers take in the light coming in the generating direction of plasma. CONSTITUTION: A spectrometer 3a receives the light coming in the generating direction (horizontal direction) of plasma 2 at the detection port 31a thereof and a spectrometer 3b receives the light coming in the direction perpendicular to the plasma generating direction reflected on a mirror 5 at the detection port 31b thereof thus spectraly analyzing the light of the plasma 2. When the concentration of a sample is low but a high sensitivity is required and the effect of coexisting substances can be neglected, light is taken in from the plasma generating direction using the spectrometer 3a. When the concentration of the sample is high and high sensitivity is not required but high accuracy is required light coming in the direction perpendicular to me plasma generating direction is taken in selectively using the spectrometer 3b.
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Patent Agency Ranking
公开(公告)号：JPH02253139A
公开(公告)日：1990-10-11
申请号：JP7556489
申请日：1989-03-28
Applicant: SEIKO INSTR INC
Inventor： HARADA YOICHI
IPC: G01N21/73
Abstract: PURPOSE:To shorten the time required for substitution of a sample and to make an analysis with a small amt. of the sample by introducing the fresh sample into an atomizing chamber, then opening a drain cock to discharge the fresh sample diluted with the already analyzed sample in a sample well. CONSTITUTION:The drain cock 1e is opened while a selector cock 5 is held set in a circulation position after the end of a certain analysis to discharge the sample in the sample well 1d as well as to discharge the sample in the tube from the sample well 1d to the cock 5 and the sample from the cock 5 to a nebulizer 2 into the atomizing chamber 1. The cock 5 is then selected at the introduction position to introduce the fresh sample into the atomizing chamber to substitute the sample in the tube from the sample well to the cock 5, the sample in the tube from the cock 5 to the nebulizer 2 and the sample sticking on the inside wall of the nebulizer 2 as well as the sample sticking on the inside wall of the atomizing chamber 1 with the fresh sample. The cock 1e is thereafter opened to discharge the fresh sample diluted with the already analyzed sample. While the cock 5 is held selected at the introduction position, the fresh sample is introduced and thereafter, the cock is selected at the circulation position and the analysis is started after plasma stabilizes.
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公开(公告)号：JP2000304612A
公开(公告)日：2000-11-02
申请号：JP11846699
申请日：1999-04-26
Applicant: SEIKO INSTR INC
Inventor： NAKANO NOBUO , HARADA YOICHI , MATSUZAWA OSAMU
Abstract: PROBLEM TO BE SOLVED: To make smoothly slidable a sine bar by providing the side of a knife edge where the sine bar slides while being in contact, with a tilt angle to a perpendicular extending from a rotary shaft of a diffraction grating toward the movement direction of the knife edge. SOLUTION: A diffraction grating 1 is so fitted as to rotates around a rotary shaft 2, with the rotary shaft 2 to which one end of a sine bar 3 is fitted. A pulse motor 7 is connected to a belt 6 with a threaded rod 5 for rotation of the threaded rod 5. A knife-edge 4 is fitted to the threaded rod 5 through a nut. The nut is so fixed not to rotate in the rotational direction of the threaded rod 5, and the rotation of the threaded rod 5 moves the nut to shift in the axial direction of the threaded rod 5. The other end of the sine bar 3 fitted to the rotary shaft 2 so contacts a side 8 not to release it. Movement of the knife-edge 4 pushes and moves the sine bar 3, resulting in rotation of the diffraction grating 1 for change in the angle.
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公开(公告)号：JPH0963534A
公开(公告)日：1997-03-07
申请号：JP21561995
申请日：1995-08-24
Applicant: SEIKO INSTR INC
Inventor： HARADA YOICHI , NAKAGAWA YOSHITOMO
Abstract: PROBLEM TO BE SOLVED: To prevent a shield from causing a discharge on a plasma and crossing magnetic flux by making the shield about as long as a work coil, and installing the shield inside the work coil. SOLUTION: A plasma 2 is formed inside a plasma torch 1 from power supplied from a high frequency power supply 6 to a work coil 4 and from gas supplied from a gas control part 5. A gap is provided between the work coil 4 and the plasma torch 1, and a shield 3 is inserted in such a way that the length of the shield 3 is about equal to the winding length of the work coil 4. Since the shield 3 and the plasma 2 are separated an appropriate amount equal to the projected length of the plasma torch 1 from the work coil 4, the plasma 2 is stably maintained without causing a discharge. Also, since the shield 3 is not projected beyond the work coil 4 to the opposite side of the plasma 2, it does not cross magnetic flux formed by the high-frequency power applied to the work coil 4, nor is it heated or damaged.
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公开(公告)号：JPH0954041A
公开(公告)日：1997-02-25
申请号：JP14623196
申请日：1996-06-07
Applicant: SEIKO INSTR INC
Inventor： HARADA YOICHI
IPC: G01N21/73
Abstract: PROBLEM TO BE SOLVED: To perform analysis safely and stably at a low cost without preparing a heat-exhausting ventilating facility, etc., by placing a metallic cone between a plasma and a light focusing system. SOLUTION: Gas is supplied into a torch pipe 1, and a high-frequency power is supplied to a working coil 3 to produce a plasma 4 inside the torch pipe 1. An analytical sample is introduced into the plasma 4 via the torch pipe 1 and excited to emit light. A cone 5 and a light focusing system 7 are provided along the direction of generation of the plasma 4. Light from the plasma 4 is transmitted through a hole 5a, impinges on the light focusing system 7 along an optical axis 6, and is focused on an incident slit 8a to perform spectral analysis. Copper or a copper alloy, both of which are electrically conductive and conduct heat well, or alumina-coated aluminum or an aluminum alloy, is used for the cone 5, Further, a cooling water piping for cooling the cone 5 is provided on the surface of the cone 5 and cooling water is introduced therein from the outside.
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公开(公告)号：JPH06241901A
公开(公告)日：1994-09-02
申请号：JP2658593
申请日：1993-02-16
Applicant: SEIKO INSTR INC
Inventor： HARADA YOICHI
Abstract: PURPOSE:To prevent the incidence of detection beam at the time of spectral measurement by allowing the detection beam with an undetectable wavelength by a main detector to be incident only at the time of the driving of a spectroscope to detect a position. CONSTITUTION:The detection beam from the light source 1 having narrow wavelength width provided above a spectral light source 2 passes through an incident slit 3 and incident on a camera mirror 4 while it is diffracted and expanded in a lateral direction. The beam becoming parallel by the mirror is incident on an auxiliary lattice 5 to be diffracted in a plureality of directions with a plurality of orders and formed into an image on an auxiliary detector 9 through a collimator mirror 7. The lattice 5 is attached to the upper part of a main lattice 6 and the lattices 5, 6 are rotationally driven at the same time by a drive part 11. According to the rotation of the lattices 5, 6, a plurality of diffracted beams due to high order diffracted beams traverse the detector 9. Since the wavelength of the detection beam is known, the position of the lattice 6 can be detected from the number of the diffracted beams traversing the detector and the positions thereof. At this time, the wavelength of the detection beam can not detected by a main detector 10 and, since the detection beam is put out at the time of spectral measurement, the spectral measurement due to the detector 10 is not obstructed.
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