Abstract:
The programmable reference voltage source (1) includes a nonvolatile memory cell (2), the floating-gate region (3) of which stores electric charges determining a memorized threshold value. The drain terminal (4) of the cell is biased at a constant voltage (D r ), and the source terminal (14) is connected to a constant-current source (21) and to the inverting input of an operational amplifier (21) having the noninverting input connected to a reference voltage (V r ) and the output (10) connected to the gate terminal (8) of the cell (2). By defining the threshold of the cell (2) as the gate voltage (measured with respect to ground) capable of causing the cell (2) to be flown by the current (I s ) set by the current source (22), the output voltage (V o ) of the operational amplifier (21) equals the threshold and may be used as a programmable reference in analog memories.
Abstract:
The charge injection circuit of this invention comprises at least one pair of floating gate MOS transistors (M1,M2) having source and drain terminals which are coupled together and to an injection node (ND), and at least one corresponding pair of generators (G1,G2) of substantially step-like voltage signals (S1,S2) having an initial value and a final value, and having outputs respectively coupled to the control terminals of said transistors (M1,M2); the signal generators (G1,G2) being such that the initial value of a first (S1) of the signals is substantially the equal of the final value of a second (S2) of the signals, and that the final value of the first signal (S1) is substantially the equal of the initial value of the second signal (S2).
Abstract:
The present invention relates to a digital-to-analog converter having a plurality of inputs (B0,B1,B2,B3) for digital signals, and an output (OUT) for an analog signal, and comprising a charge integration circuit (INT) having an input and an output coupled to the converter output, and a plurality of floating gate MOS transistors (M01, M11,M21,M31) corresponding to the plurality of converter inputs, having their source and drain terminals coupled all together and to the input (ND) of the integration circuit (INT), and having control terminals coupleable, under control from the inputs of the plurality, to different references (VCC,GND) of potential having selected fixed values.
Abstract:
An input structure (1) for associative memories, including an array of elementary cells (2), a number of input lines (20), a number of output lines (30), a number of address lines (40), and a number of enabling lines (50). Each elementary cell (2) is formed by a D type latch (3) having a data input connected to one of the address lines (40) and an enabling input connected to one of the enabling lines (50), and by a switch (4) connected between an input line and an output line, and having a control input connected to the output of a respective latch to selectively connect the respective input line (20) and output line (30) according to the data stored in the latch.
Abstract:
Non-volatile memory cell with double level of polycrystalline silicon comprising a source region (38), a drain region (31), a channel region (34) between said source and drain regions, a floating gate (33), and a control gate (32) in which the channel region area extends into two lateral zones beneath the two gates and perpendicular to the source-drain direction.