Abstract:
A method for sensing multiple-levels non-volatile memory cells which can take one programming level among a plurality of m=2 n (n > = 2) different programming levels, provides for biasing a memory cell (MC) to be sensed in a predetermined condition, so that the memory cell (MC) sinks a cell current (IC) with a value belonging to a discrete set of m distinct cell current values (IC0-IC15), each cell current value (IC0-IC15) corresponding to one of said programming levels. The sensing method also provides for: simultaneously comparing the cell current (IC) with a prescribed number of reference currents (IR1,IR2,IR3) having values comprised between a minimum value and a maximum value of said discrete set of m cell current values (IC0-IC15) and dividing said discrete set of m cell current values (IC0-IC15) in a plurality of sub-sets of cell current values, for determining the sub-set of cell current values to which the cell current (IC) belongs; repeating step a) for the sub-set of cell current values to which the cell current (IC) belongs, until the sub-set of cell current values to which the cell current (IC) belongs comprises only one cell current value, which is the value of the current (IC) of the memory cell (MC) to be sensed.
Abstract:
A non-overlapping phase, signal generator (1) comprises first and second loop oscillators (O1,O2) including cascaded inverters. Defined in each cascade of inverters are first and second circuit nodes between the inverters. Between the first node (2) of the first oscillator and the second node (3A) of the second oscillator, there is connected a transistor having a control terminal connected to the first node of the second oscillator. Connected between the first node (2A) of the second oscillator (O2) and the second node (3) of the first oscillator is a transistor having a control terminal connected to the first node of the first oscillator (O1).
Abstract:
A fast capacitive - load driving circuit for driving output nodes on an integrated circuit. This circuit reduces noise interference caused by parasitic inductance by lowering the inductance voltage on the power supply lines during the switching process. This invention includes a voltage ramp (B1), a voltage-to-current converter (B2), and an output buffer having at least one pull-down transistor (MD). A further embodiment includes an output buffer possessing a pull-down (MD) and a pull-up transistor (MU).
Abstract:
In a chain of fully differential amplifiers, comprising at least two cascaded amplifiers, the stabilization of the output common mode voltage of an amplifier is implemented by sensing the value of such a voltage by means of a dedicated terminal connected to a circuit node corresponding to the sources connected in common of the input differential pair of transistors of an amplifier which follows in the chain of cascaded amplifiers. Such a voltage is compared with a reference voltage to which, by means of a level shifting circuit, a voltage equivalent to the threshold voltage of the said transistors forming said input pair is subtracted thus obtaining an error signal of the output common voltage of said amplifier to be stabilized which may be applied to a dedicated control terminal thereof. The system of the invention provides for the sensing of the output common mode voltage without loading the ouputs of the amplifier to be stabilized and it is more easily implemented than known systems.
Abstract:
A circuit for generating positive and negative boosted voltages, comprising first (El-pos) and second (El-neg) voltage booster circuits, respectively for positive and negative voltages, which have output terminals interconnected at a common node (N). It comprises two tristate logic gate circuits for coupling said voltage booster circuits to a positive supply voltage generator (Vdd,GND) and additional tristate logic gate circuits for driving the phases of charge pump circuits incorporated to the booster circuits. This voltage generating circuit may be integrated in single-well CMOS technology.
Abstract:
A voltage regulator for electrically programmable, non-volatile memory devices, having an output terminal connected to a power supply line for programming the state of at least one memory element through at least one selection circuit means (MW,MB) and comprising at least first (R1) and second (R2) resistive elements connected between first and second terminals of a voltage supply. The regulator further comprises at least a second circuit means (MWd,MBd) being the homolog of the selection circuit means for programming the memory element, said second circuit means being connected serially to the resistive elements (R1,R2) across the two terminals of the voltage supply. Also provided is at least one controlled current generator (G1,G2) connected between one of the two voltage supply terminals and a linking node to one of the resistive elements and an operational amplifier (A) whose non-inverting (+) input is connected to a linking node to at least one of the resistive elements and whose output terminal is the output terminal of the regulator.
Abstract:
A first N-channel transistor (M1) and a second N-channel transistor (M2) are cascode connected and the source electrode of the first transistor is connected to the ground; a third P-channel transistor (M3) and a fourth P-channel transistor (M4) are also cascode connected, and the source of the fourth transistor is connected to a supply voltage; the drains of the second and third transistors (M2, M3) are mutually connected to act as output terminal. According to the invention, the absolute values of the threshold voltages of the second and third transistors are lower than the threshold voltages of the first and fourth transistors, and the gates of the first and second transistors are furthermore mutually connected to act as input terminal for a voltage signal, while the gates of said third and fourth transistors are mutually connected to act as input terminal for a bias voltage.