Mixed parallel-dichotomic serial sensing method for sensing multiple-levels non-volatile memory cells, and sensing circuit actuating such method
    1.
    发明公开
    Mixed parallel-dichotomic serial sensing method for sensing multiple-levels non-volatile memory cells, and sensing circuit actuating such method 失效
    使用这样的方法并行非易失多电平存储器单元和感测电路的混合串行二分感测方法

    公开(公告)号:EP0757355A1

    公开(公告)日:1997-02-05

    申请号:EP95830347.1

    申请日:1995-07-31

    Abstract: A method for sensing multiple-levels non-volatile memory cells which can take one programming level among a plurality of m=2 n (n > = 2) different programming levels, provides for biasing a memory cell (MC) to be sensed in a predetermined condition, so that the memory cell (MC) sinks a cell current (IC) with a value belonging to a discrete set of m distinct cell current values (IC0-IC15), each cell current value (IC0-IC15) corresponding to one of said programming levels. The sensing method also provides for: simultaneously comparing the cell current (IC) with a prescribed number of reference currents (IR1,IR2,IR3) having values comprised between a minimum value and a maximum value of said discrete set of m cell current values (IC0-IC15) and dividing said discrete set of m cell current values (IC0-IC15) in a plurality of sub-sets of cell current values, for determining the sub-set of cell current values to which the cell current (IC) belongs; repeating step a) for the sub-set of cell current values to which the cell current (IC) belongs, until the sub-set of cell current values to which the cell current (IC) belongs comprises only one cell current value, which is the value of the current (IC) of the memory cell (MC) to be sensed.

    Abstract translation: 这可能需要m的多元性中的一个编程电平,用于感测多电平非易失性存储器单元的方法= 2 (N> = 2)不同的编程的水平,提供了一种用于偏置的存储单元(MC)被感测到的 在预定条件下,所以没有存储器单元(MC)汇的单元电流(IC)与值属于一组离散的m个不同的单元电流值的(IC 0-IC15),每个单元的电流值(IC 0-IC15)对应 与所述编程水平之一。 所述sensingmethod因此提供用于:同时单元电流(IC)与参考电流(IR1,IR2,IR3)的最小值和所述离散组m个单元电流值的最大值之间由具有值的规定数量的比较( IC 0-IC15)和将所述离散组m个单元电流值的(IC 0-IC15)(在子集的单元电流值的复数,用于确定性采矿子集小区的电流值,以该单元电流IC)属于 ; 重复步骤a)用于单元电流值的子集到的电池电流(IC)所属直到单元电流值的子集到的电池电流(IC)属于仅包括一个单元电流值,在所有其 要被感测的存储单元(MC)的电流(IC)的值。

    Multilevel non-volatile memory devices
    2.
    发明公开
    Multilevel non-volatile memory devices 失效
    MehrpegelnichtflüchtigeSpeicherannnung

    公开(公告)号:EP0825611A1

    公开(公告)日:1998-02-25

    申请号:EP96830455.0

    申请日:1996-08-22

    CPC classification number: G11C11/5621 G11C11/5628 G11C16/102 G11C2211/5621

    Abstract: In a storage device of the multi-level type, comprising a plurality of memory cells addressable through an address input (RADR,CADR), each cell being adapted for storing more than one binary information element in a MOS transistor which has a control gate, and a floating gate for storing electrons to modify the threshold voltage of the transistor, and comprising a circuit enabling a Direct Memory Access (DMA) mode for directly accessing the memory cells from outside the device, the memory cells are programmed in the direct memory access mode by controlling, from outside the device, the amount of charge stored into the floating gate of each transistor.

    Abstract translation: 在多级类型的存储装置中,包括可通过地址输入(RADR,CADR)寻址的多个存储器单元,每个单元适于在具有控制栅极的MOS晶体管中存储多于一个的二进制信息元素, 以及用于存储电子以修改晶体管的阈值电压的浮动栅极,并且包括能够进行从设备外部直接访问存储器单元的直接存储器访问(DMA)模式的电路,存储器单元被编程在直接存储器存取 模式通过从器件外部控制存储在每个晶体管的浮置栅极中的电荷量。

    Page-mode memory device with multiple-level memory cells
    3.
    发明公开
    Page-mode memory device with multiple-level memory cells 失效
    Seitenmodusspeicher mit Mehrpegelspeicherzellen

    公开(公告)号:EP0811986A1

    公开(公告)日:1997-12-10

    申请号:EP96830318.0

    申请日:1996-06-05

    Abstract: A page-mode semiconductor memory device comprises a matrix (1) of memory cells (MC') arranged in rows (R) and columns (C), each row (R) forming a memory page (MP1-MPn) of the memory device and comprising at least one group (MW1,MW2-MW2m-1,MW2m) of memory cells (MC'), memory page selection means (2) for selecting a row (R) of the matrix (1), and a plurality of sensing circuits (3') each one associated to a respective column (C) of the matrix. The memory cells (MC') are multiple-level memory cells which can be programmed in a plurality of c=2 b (b>1) programming states to store b information bits, and the sensing circuits (3') are serial-dichotomic sensing circuits capable of determining, in a number b of consecutive approximation steps, the b information bits stored in the memory cells (MC'), at each step one of said b information bits being determined, said at least one group (MW1,MW2-MW2m-1,MW2m) of memory cells (MC') of a row (R) forming a number b of memory words of a memory page (MP1-MPn).

    Abstract translation: 页模式半导体存储器件包括以行(R)和列(C)排列的存储单元(MC')的矩阵(1),每行(R)形成存储器件的存储器页(MP1-MPn) 并且包括用于选择矩阵(1)的行(R)的至少一个组(MW1,MW2-MW2m-1,MW2m)的存储器单元(MC'),存储器页选择装置(2) 每个检测电路(3')与矩阵的相应列(C)相关联。 存储单元(MC')是可以以多个c = 2(b> 1)编程状态编程的多级存储器单元,用于存储b个信息位,并且感测电路(3')是串行 所述至少一个组(MW1)包括:在所述b个信息比特中的每个步骤中确定所述b个信息比特中的每个步骤中存储的存储单元(MC')中的b个信息比特, ,MW2-MW2m-1,MW2m)形成存储器页(MP1-MPn)的存储器字数b的行(R)的存储器单元(MC')。

    Reading circuit for multilevel non-volatile memory cell devices
    4.
    发明公开
    Reading circuit for multilevel non-volatile memory cell devices 失效
    Mehrpegel-Speicherzellenanordnungen的Leseschaltungfürnichtflüchtige

    公开(公告)号:EP0735542A1

    公开(公告)日:1996-10-02

    申请号:EP95830127.7

    申请日:1995-03-31

    CPC classification number: G11C11/5642 G11C11/5621 G11C2211/5631

    Abstract: Reading circuit for multilevel non-volatile memory cell devices comprising for each cell to be read a selection line with which is associated a load (ML) and a decoupling and control stage (MF) with a feedback loop (INV) which stabilizes the voltage on a circuit node (F) of the selection line.
    To this node are connected the current replica circuit means which are controlled by the feedback loop (INV).
    These include loads (M1,M2,M3) and circuit elements (MC1,MC2,MC3) homologous to those associated with the selection line of the memory cell and have output interface circuit means (A,B,C) for connection to current comparator circuit means.

    Abstract translation: 用于多电平非易失性存储单元器件的读取电路,包括用于读取与负载(ML)和解耦和控制级(MF)相关联的选择线的每个单元与具有稳定电压的反馈回路(INV) 选择线的电路节点(F)。 该节点连接由反馈回路(INV)控制的当前复制电路装置。 这些包括与存储器单元的选择线相关联的负载(M1,M2,M3)和电路元件(MC1,MC2,MC3),并具有用于连接到电流比较器的输出接口电路装置(A,B,C) 电路方式。

    Sensing circuit for serial dichotomic sensing of multiple-levels non-volatile memory cells
    5.
    发明公开
    Sensing circuit for serial dichotomic sensing of multiple-levels non-volatile memory cells 失效
    Leseschaltungfürserielle dichotomischeAbfühlungvon mehrschichtigennichtflüchtigenSpeicherzellen

    公开(公告)号:EP0734024A1

    公开(公告)日:1996-09-25

    申请号:EP95830110.3

    申请日:1995-03-23

    CPC classification number: G11C11/5621 G11C11/5642 G11C2211/5632

    Abstract: A sensing circuit for serial dichotomic sensing of multiple-levels memory cells (MC) which can take one programming level among a plurality of m=2 n (n >= 2) different programming levels, comprises biasing means for biasing a memory cell (MC) to be sensed in a predetermined condition, so that the memory cell (MC) sinks a cell current (IC) with a value belonging to a plurality of m distinct cell current values (IC0-IC3), each cell current value (IC0-IC3) corresponding to one of the programming levels, a current comparator (1) for comparing the cell current (IC) with a reference current (IR) generated by a variable reference current generator (G), and a successive approximation register (2) supplied with an output signal (CMP) of the current comparator (1) and controlling the variable reference current generator (G). The variable reference current generator comprises an offset current generator (Ioff) permanently coupled to the current comparator (1), and m-2 distinct current generators (IR0,IR1), independently activatable by the successive approximation register (2), each one generating a current (IC1,IC2) equal to a respective one of the plurality of cell current values (IC0-IC3).

    Abstract translation: 一种用于多级存储器单元(MC)的串行二分感测的感测电路,其可以在多个m = 2n(n> = 2)不同编程电平中取一个编程电平,包括用于偏置存储器单元 (MC),以使得存储单元(MC)以具有多个m个不同的单元电流值(IC0-IC3),每个单元电流值(IC0-IC3)的值吸收单元电流(IC) IC0-IC3),用于将电池电流(IC)与可变参考电流发生器(G)产生的参考电流(IR)进行比较的电流比较器(1)和逐次逼近寄存器( 2)提供电流比较器(1)的输出信号(CMP)并控制可变参考电流发生器(G)。 可变参考电流发生器包括永久地耦合到电流比较器(1)的偏移电流发生器(Ioff)和由逐次逼近寄存器(2)独立激活的m-2个不同的电流发生器(IR0,IR1),每个发生器 等于多个单元电流值(IC0-IC3)中的相应一个的电流(IC1,IC2)。

    Successive approximation method for sensing multiple-level non-volatile memory cells and sensing circuit using such method
    6.
    发明公开
    Successive approximation method for sensing multiple-level non-volatile memory cells and sensing circuit using such method 失效
    部一步方法方法用于非易失性多电平存储器单元和对应的采样的扫描

    公开(公告)号:EP0724266A1

    公开(公告)日:1996-07-31

    申请号:EP95830023.8

    申请日:1995-01-27

    CPC classification number: G11C11/5642 G11C11/5621 G11C2211/5632

    Abstract: A successive approximation method for sensing multiple-level non-volatile memory cells which can take one of m=2 n (n >=2) different programming levels, provides for biasing a memory cell (MC) to be sensed in a predetermined condition, so that the memory cell (MC) sinks a cell current (IC) with a value belonging to a plurality of m distinct cell current values (IC0-IC3;IC0-IC15), and for : a) comparing the cell current (IC) with a reference current (IR) which has a value comprised between a minimum value and a maximum value of said plurality of m cell current values (IC0-IC3;IC0-IC15), thus dividing said plurality of cell current values (IC0-IC3;IC0-IC15) into two sub-pluralities of cell current values, and determining the sub-plurality of cell current values to which the cell current (IC) belongs; b) repeating the step a) until the sub-plurality of cell current values to which the cell current (IC) belongs comprises only one cell current value, which is the value for the current (IC) of the memory cell (MC) to be sensed.

    Abstract translation: 用于感测多级非易失性存储器单元逐次逼近方法,其可以采取m个= 2 (N> = 2)不同的编程的水平,提供了一种用于偏置的存储单元(MC)将被在预定的感测到的 条件,所以没有存储器单元(MC)汇的单元电流(IC)与值属于m个不同的单元电流值的多个(IC 0-IC3; IC 0-IC15),以及用于:1)将所述的单元电流( IC)与参考电流(IR),其具有最小值和米单元电流值的所述多个(IC 0-IC3的最大值之间包含的值; IC 0-IC15),从而划分单元电流值的所述多个(IC 0 -IC3; IC 0-IC15)成细胞电流值的两个子多个,和确定性采矿到的电池电流(IC)所属的单元电流值的次多个; B)重复所述步骤a),直至至哪个单元电流(IC)属于仅包括一个单元电流值的单元电流值的次多个,所有这些是存储单元(MC),以用于当前(IC值) 进行检测。

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