公开(公告)号：JPS634650B2

公开(公告)日：1988-01-29

申请号：JP18553380

申请日：1980-12-29

Applicant: SHIMADZU CORP

Inventor： AMISAWA YOSHIO ,  FURUSAWA KAZUO ,  AKYAMA OSAMU ,  TAKADA MICHINOSUKE

IPC: G01J3/04 ,  G01J3/18 ,  G01J3/36 ,  G01N21/27

公开(公告)号：JPH02201230A

公开(公告)日：1990-08-09

申请号：JP2215489

申请日：1989-01-31

Applicant: SHIMADZU CORP

Inventor： AMISAWA YOSHIO ,  TAMAI TETSUO

IPC: G01J3/02

Abstract: PURPOSE:To achieve a higher measuring accuracy by employing a filter having an inclination of a spectral characteristic in a calibration wavelength range as filter for calibration to determine a wavelength error of a spectroscope to be inspected by a specified formula. CONSTITUTION:An inclination of spectral characteristic is used as filter for calibration of wavelengths to determine a wavelength error DELTAlambda of a spectroscope to be inspected by a wavelength error DELTAlambda=(A-Ao+Ck B)/k. Here, Ao represents absorbance at a specified wavelength of an inclination characteristic portion of the filter as measured with a spectrophotometer with a sufficiently high accuracy and a narrow wavelength range, A absorbance of the filter as measured with the spectroscope to be inspected, B a wavelength band range of a transmission light in the spectroscope to be inspected, k an absorbance difference per unit wavelength difference of the inclination characteristic portion of the filter and C a numerical constant. Moreover, this achieves a higher reliability in wavelength calibration using this filter in multiple kinds.

公开(公告)号：JPS57111422A

公开(公告)日：1982-07-10

申请号：JP18553380

申请日：1980-12-29

Applicant: SHIMADZU CORP

Inventor： AMISAWA YOSHIO ,  FURUSAWA KAZUO ,  AKIYAMA OSAMU ,  TAKADA MICHINOSUKE

IPC: G01J3/04 ,  G01J3/18 ,  G01J3/36 ,  G01N21/27

Abstract: PURPOSE:To obtain a spectrum measuring device having high image resolution with a low cost by securing such constitution in which the wavelength ranges of the spectrum images of the beams incident to a diffraction grating with different incident angles and through plural slits are consecutively formed into an image on a 1-dimensional image pickup element. CONSTITUTION:The beams of a tungsten electric bulb W and a heavy hydrogen lamp D are successively condensed to slits S1-S4 via a condenser lens L and a sample cell 2 through semitransparent mirrors M1-M4, the aperture N of a shutter 5 and filters f1-f4, respectively. The spectrums incident to a concave diffraction grating 6 through the slits S1-S4 and with different incident angles are formed into an image on a 1-dimensional image pickup element 7 so that the spectrum regions are consecutive to each other. The diffracted beams of different numbers of order are deleted through the filters f1-f4. In such a way, a spectrum measuring device having high image resolution can be obtained with a low cost.