1.
    发明专利
    未知

    公开(公告)号:DE3882926D1

    公开(公告)日:1993-09-09

    申请号:DE3882926

    申请日:1988-11-28

    Applicant: SHIMADZU CORP

    Abstract: Method and apparatus for emission spectroscopic analysis by spark discharge, wherein each and every one of a number of spark discharges conducted for analysis of a sample comprises a high energy portion providing a sufficient amount of energy to vaporize the elements contained in the sample and a low energy portion providing a sufficient amount of energy to cause the vaporized elements to emit light, and wherein spectroscopic measurement is conducted in the low energy portion, or initiated in the end portion of the high energy portion to continue in the low energy portion.

    3.
    发明专利
    未知

    公开(公告)号:DE69204872T2

    公开(公告)日:1996-05-15

    申请号:DE69204872

    申请日:1992-03-20

    Applicant: SHIMADZU CORP

    Abstract: A quantitative analysis of the ingredients in a specimen (3) with classification by the conditions of the ingredients in the specimen, using a spectroscopic analysis is made by exiting the specimen (3) a number of times for emission, detecting the light intensity data of the line of the ingredient element and the non-ingredient element of the specimen per emission, storing (22) the light intensity data of the line, specifying emission which contains the ingredient element and the non-ingredient element over a predetermined level based on the stored data, and determining the presence of a composition of the ingredient element and the non-ingredient element at a portion of the specimen corresponding to the specified emission.

    4.
    发明专利
    未知

    公开(公告)号:DE3882926T2

    公开(公告)日:1993-12-09

    申请号:DE3882926

    申请日:1988-11-28

    Applicant: SHIMADZU CORP

    Abstract: Method and apparatus for emission spectroscopic analysis by spark discharge, wherein each and every one of a number of spark discharges conducted for analysis of a sample comprises a high energy portion providing a sufficient amount of energy to vaporize the elements contained in the sample and a low energy portion providing a sufficient amount of energy to cause the vaporized elements to emit light, and wherein spectroscopic measurement is conducted in the low energy portion, or initiated in the end portion of the high energy portion to continue in the low energy portion.

    5.
    发明专利
    未知

    公开(公告)号:DE69030785D1

    公开(公告)日:1997-07-03

    申请号:DE69030785

    申请日:1990-02-26

    Applicant: SHIMADZU CORP

    Abstract: Apparatus for emission spectrochemical analysis of a sample containing elements to be analyzed, wherein the sample is cyclically excited with relatively high energy to vaporize the sample elements and successively with relatively low energy to cause the vaporized elements to emit light containing spectral lines characteristic of the elements, which spectral lines are detected by a plurality of photomultiplier tubes corresponding to the spectral lines, with a common negative high-voltage source connected to the dynodes of the photomultiplier tubes. The negative high-voltage source is controlled in such a manner that it supplies a negative high voltage to the dynodes of the photomultiplier tubes to activate the tubes only during the low-energy excitation of the sample.

    6.
    发明专利
    未知

    公开(公告)号:DE3786027T2

    公开(公告)日:1994-01-20

    申请号:DE3786027

    申请日:1987-03-13

    Applicant: SHIMADZU CORP

    Abstract: The method and apparatus for analyzing a sample by means of an Inductively-Coupled Radio Frequency Plasma (ICP) comprising a switch valve means (16) for switching the flow of a sample comprises the steps of: first switching the switch valve (16) to the side of a plasma torch (2) only during an ICP analyzing time; first supplying an induction coil (10) with a first radio frequency electric power and a plasma torch first volume of gas to excite a plasma; analyzing the plasma; second switching the switch valve (16) to an exit side (26 min ) of the sample during the times except for the ICP analyzing time; and second supplying to the induction coil (10) a second radio frequency electric power and a plasma torch second volume of gas to keep a pilot light plasma. The cost of an ICP analysis can be greatly reduced if the system maintained at the condition of a pilot light except for the analyzing periods.

    APPARATUS FOR EMISSION SPECTROCHEMICAL ANALYSIS

    公开(公告)号:DE2962904D1

    公开(公告)日:1982-07-08

    申请号:DE2962904

    申请日:1979-09-26

    Applicant: SHIMADZU CORP

    Abstract: Apparatus for emission spectrochemical analysis wherein the sample to be analyzed is excited by repeated spark discharge to emit light, which is dispersed to produce a spectrum containing emission lines characteristic of the elements in the sample. The intensity or quantity of light of each of the emission lines of the elements to be determined and that of the corresponding one of the emission lines selected as the internal standards for the elements to be determined are measured each time a spark discharge is produced to obtain the ratio of the former intensity or quantity to the latter at each spark discharge, and the ratios resulting from a predetermined number of spark discharges are averaged for each of the elements to be determined. From the average the content of each of the elements is read on a calibration curve.

    8.
    发明专利
    未知

    公开(公告)号:DE69204872D1

    公开(公告)日:1995-10-26

    申请号:DE69204872

    申请日:1992-03-20

    Applicant: SHIMADZU CORP

    Abstract: A quantitative analysis of the ingredients in a specimen (3) with classification by the conditions of the ingredients in the specimen, using a spectroscopic analysis is made by exiting the specimen (3) a number of times for emission, detecting the light intensity data of the line of the ingredient element and the non-ingredient element of the specimen per emission, storing (22) the light intensity data of the line, specifying emission which contains the ingredient element and the non-ingredient element over a predetermined level based on the stored data, and determining the presence of a composition of the ingredient element and the non-ingredient element at a portion of the specimen corresponding to the specified emission.

    10.
    发明专利
    未知

    公开(公告)号:DE69030785T2

    公开(公告)日:1997-12-04

    申请号:DE69030785

    申请日:1990-02-26

    Applicant: SHIMADZU CORP

    Abstract: Apparatus for emission spectrochemical analysis of a sample containing elements to be analyzed, wherein the sample is cyclically excited with relatively high energy to vaporize the sample elements and successively with relatively low energy to cause the vaporized elements to emit light containing spectral lines characteristic of the elements, which spectral lines are detected by a plurality of photomultiplier tubes corresponding to the spectral lines, with a common negative high-voltage source connected to the dynodes of the photomultiplier tubes. The negative high-voltage source is controlled in such a manner that it supplies a negative high voltage to the dynodes of the photomultiplier tubes to activate the tubes only during the low-energy excitation of the sample.

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