公开(公告)号：DE2962904D1

公开(公告)日：1982-07-08

申请号：DE2962904

申请日：1979-09-26

Applicant: SHIMADZU CORP

Inventor： IMAMURA NAOKI ,  FUKUI ISAO ,  ONO JUNICHI

IPC: G01N21/67 ,  G01J3/28 ,  G01J3/36 ,  G01J3/38

Abstract: Apparatus for emission spectrochemical analysis wherein the sample to be analyzed is excited by repeated spark discharge to emit light, which is dispersed to produce a spectrum containing emission lines characteristic of the elements in the sample. The intensity or quantity of light of each of the emission lines of the elements to be determined and that of the corresponding one of the emission lines selected as the internal standards for the elements to be determined are measured each time a spark discharge is produced to obtain the ratio of the former intensity or quantity to the latter at each spark discharge, and the ratios resulting from a predetermined number of spark discharges are averaged for each of the elements to be determined. From the average the content of each of the elements is read on a calibration curve.

公开(公告)号：DE69204872D1

公开(公告)日：1995-10-26

申请号：DE69204872

申请日：1992-03-20

Applicant: SHIMADZU CORP

Inventor： FUKUI ISAO ,  IMAMURA NAOKI ,  MIYAMA TAKAO

IPC: G01J3/30 ,  G01J3/443 ,  G01N21/67 ,  G01N21/71 ,  G01J3/36

Abstract: A quantitative analysis of the ingredients in a specimen (3) with classification by the conditions of the ingredients in the specimen, using a spectroscopic analysis is made by exiting the specimen (3) a number of times for emission, detecting the light intensity data of the line of the ingredient element and the non-ingredient element of the specimen per emission, storing (22) the light intensity data of the line, specifying emission which contains the ingredient element and the non-ingredient element over a predetermined level based on the stored data, and determining the presence of a composition of the ingredient element and the non-ingredient element at a portion of the specimen corresponding to the specified emission.

公开(公告)号：DE69204872T2

公开(公告)日：1996-05-15

申请号：DE69204872

申请日：1992-03-20

Applicant: SHIMADZU CORP

Inventor： FUKUI ISAO ,  IMAMURA NAOKI ,  MIYAMA TAKAO

IPC: G01J3/30 ,  G01J3/443 ,  G01N21/67 ,  G01N21/71 ,  G01J3/36

Abstract: A quantitative analysis of the ingredients in a specimen (3) with classification by the conditions of the ingredients in the specimen, using a spectroscopic analysis is made by exiting the specimen (3) a number of times for emission, detecting the light intensity data of the line of the ingredient element and the non-ingredient element of the specimen per emission, storing (22) the light intensity data of the line, specifying emission which contains the ingredient element and the non-ingredient element over a predetermined level based on the stored data, and determining the presence of a composition of the ingredient element and the non-ingredient element at a portion of the specimen corresponding to the specified emission.

公开(公告)号：JPH08211296A

公开(公告)日：1996-08-20

申请号：JP3778395

申请日：1995-02-03

Applicant: SHIMADZU CORP

Inventor： IMAMURA NAOKI

IPC: G02B21/00 ,  G02B21/06

Abstract: PURPOSE: To increase the scanning speed and to stably specify a measurement point position by providing a light source, a detector and a confocal optical system in which a light source unit and a detection unit are made into one- to-one correspondence. CONSTITUTION: The microscope is provided with a detector array D, a point light source array S, a half mirror H and a lens L. The array D and the lens L are arranged on a same optical axis (a main axis). The array S is arranged with an angle of 90 deg. with respect to the main axis on the light axis. Moreover, the mirror H is placed on the axis with an angle of 45 deg.. Thus, the array S and the array D are placed in an optically coupled manner through the mirror H. Therefore, a detection element a' on the array D is optically coupled to a light emitting element a on the array S. Hence, the light beam emitted from the element a is reflected by the mirror H and is image formed at a point b on a sample 0 by the lens L. The reflected light beam or electromagnetic waves from the point b are image formed on the detection element at the point a' of the array D.

公开(公告)号：JPH0467144B2

公开(公告)日：1992-10-27

申请号：JP16100883

申请日：1983-08-31

Applicant: SHIMADZU CORP

Inventor： IMAMURA NAOKI

IPC: G01N21/67

公开(公告)号：JPH04294258A

公开(公告)日：1992-10-19

申请号：JP8352491

申请日：1991-03-22

Applicant: SHIMADZU CORP

Inventor： FUKUI ISAO ,  IMAMURA NAOKI ,  MIYAMA TAKAO

IPC: G01J3/30 ,  G01J3/443 ,  G01N21/67 ,  G01N21/71

Abstract: PURPOSE:To enable quantitative analysis in terms of existence forms of respective component elements in a sample by using emission spectrochemical analysis. CONSTITUTION:In spark discharge emission spectrochemical analysis, bright line light intensities of respective component elements in a sample and a non- component element which is combined with these component elements such as oxygen or nitrogen are measured, and bright line light intensity of each element for every discharge is stored. Discharges wherein bright lines of the non-component element exist and also bright line light intensity of the component elements is at a constant level or higher are specified, and in each of the specified discharges a compound of the element whose bright line light intensity is at a constant level or higher and the non-component element is decided to exist in the discharge region.

公开(公告)号：JPH01143935A

公开(公告)日：1989-06-06

申请号：JP30398687

申请日：1987-11-30

Applicant: SHIMADZU CORP

Inventor： OKADA KOJI ,  MIZUKAMI HARUO ,  DAIHO KENSUKE ,  IMAMURA NAOKI

IPC: G01N21/73

Abstract: PURPOSE:To enable the stable emission analysis of even a slight amt. of hardly volatile sample with high sensitivity by effecting a spark discharge or arc discharge between a sample rod and counter electrode through the plasma formed on a plasma torch. CONSTITUTION:A sample base 5 is removably provided on a central pipe 3 of a plasma torch T. This sample base 5 and the counter electrode 6 disposed above the plasma torch T are connected to both electrodes of a power supply 7 for spark discharge or arc discharge. The sample base 5 is connected to an igniter 8 which generates the corona discharge from the sample base. The spark discharge or arc discharge is effected between the sample rod and the counter electrode 6 through the plasma flame F formed on the plasma torch T. Since the sample is evaporated by the high temp. of the spark discharge or arc discharge, the analysis is possible even with the hardly volatile sample and since the evaporation place of the sample is the central pipe 3 of the plasma torch T, the distance from the evaporation place of the sample to the plasma flame F is short. The evaporated sample is thus effectively sent to the plasma flame F without being stuck to the pipe wall.

公开(公告)号：JPH01118752A

公开(公告)日：1989-05-11

申请号：JP27622187

申请日：1987-10-31

Applicant: SHIMADZU CORP

Inventor： OKADA KOJI ,  MIZUKAMI HARUO ,  DAIHO KENSUKE ,  IMAMURA NAOKI

IPC: G01N21/73

Abstract: PURPOSE:To make analysis with good S/N possible by splashing the sample powder on a sample holder by the tip of filamentary plasma so that the powder is introduced into a plasma flame. CONSTITUTION:A central tube T1 of a plasma torch is a sample supply tube to which a carrier gas is sent. Gaseous plasma to form the plasma flame is supplied to an intermediate tube T2 and a cooling gas to a sleeve tube T3. Gaseous argon is supplied to the respective tubes T1-T3 of the plasma torch. The plasma flame P is ignited when high-frequency electric power is supplied to a high-frequency coil C and a high voltage to the sample holder B by a high-voltage generator H. The filamentous plasma F extends downward in the central tube T1 and arrives at the front end part of the sample holder B when said plasma flame P is formed. The sample powder is splashed at this moment and is entrained in the flow of the carrier gas. Even a slight amt. of the sample is introduced at one time into the plasma flame and, therefore, the analysis with the good S/N is enabled.

公开(公告)号：JPS642890B2

公开(公告)日：1989-01-19

申请号：JP17302282

申请日：1982-09-30

Applicant: SHIMADZU CORP

Inventor： FUKUI ISAO ,  IMAMURA NAOKI

IPC: G01N21/67

公开(公告)号：JPS63210754A

公开(公告)日：1988-09-01

申请号：JP4418887

申请日：1987-02-27

Applicant: SHIMADZU CORP

Inventor： OKADA KOJI ,  IMAMURA NAOKI ,  OMORI YOSHIHISA

IPC: G01N21/73

Abstract: PURPOSE:To prevent the drop of a plasma temp. by inserting a sample introducing bar which is disposed with a sample receiving tray at the top end and a sample heating heater in the lower part of the receiving tray, respectively, into a plasma torch from the lower side thereof in such a manner that said bar can be inserted into and removed from the torch and can be vertically moved. CONSTITUTION:The plasma torch P is constituted of triple pipes; a central pipe 1 for a carrier gas, an intermediate pipe 2 for supplying a gas for forming a plasma flame and a sleeve pipe 3 for supplying a cooling gas. A high-frequency coil 4 for forming the plasma flame 5 is disposed on the outside of the pipe 3. The sample introducing bar 6 provided with the sample receiving tray 7 at the top end is vertically movably inserted into the pipe 1. The bar 6, in the receiving tray 7 of which a sample soln. is dropped, is then inserted into the pipe 1 and the sample is evaporated by a heater 8. The vapor thereof is entrained in the carrier gas and is introduced into the plasma flame 5 so that the sample emits light. Observation of the progress of the sample evaporation with time is thereby permitted without decreasing the plasma temp. and without disturbing the evaporation with time.