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公开(公告)号：DE602005011512D1
公开(公告)日：2009-01-22
申请号：DE602005011512
申请日：2005-03-09
Applicant: SHIMADZU CORP
Inventor： HARADA TAKAHIRO
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公开(公告)号：EP2988316A4
公开(公告)日：2016-11-23
申请号：EP14784897
申请日：2014-04-09
Applicant: SHIMADZU CORP
Inventor： HARADA TAKAHIRO
CPC classification number: H01J49/164 , H01J49/04 , H01J49/40
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公开(公告)号：JP2009168448A
公开(公告)日：2009-07-30
申请号：JP2006158597
申请日：2006-06-07
Applicant: National Institutes Of Natural Sciences , Shimadzu Corp , 大学共同利用機関法人自然科学研究機構 , 株式会社島津製作所
Inventor： SETO MITSUTOSHI , NIIMA SHUICHI , SUGIURA YUKI , FURUTA MASARU , HARADA TAKAHIRO
Abstract: PROBLEM TO BE SOLVED: To provide a sample adjusting method for mass analysis due to a matrix assisting laser elimination ionization method for forming the fine crystals of a matrix and a biomolecule such as biomolecule protein or the like on biotissue in order to form ions with high efficiency to enable measurement of high sensitivity. SOLUTION: A matrix solution is preliminarily sprayed on a protein sample to preform the fine crystal layer of the matrix. When the matrix solution is further dispensed on the fine crystal layer, crystals grow using preformed fine matrix crystals as nuclei. Accordingly, very fine homogenous eutectic crystals are formed and mass analysis due to MALDI can be performed with high sensitivity. COPYRIGHT: (C)2009,JPO&INPIT
Abstract translation: 要解决的问题：为了提供用于在生物组织上形成基质和生物分子如生物分子蛋白等的微细晶体的基质辅助激光消除电离法的质量分析的样品调节方法，以形成 离子具有高效率，能够测量高灵敏度。 解决方案：将基质溶液预先喷洒在蛋白质样品上以预成型基体的细晶层。 当将基质溶液进一步分配在细晶层上时，晶体会使用预成型的细晶体晶体生长成核。 因此，形成非常细的均匀共晶晶体，并且可以以高灵敏度进行由MALDI引起的质量分析。 版权所有（C）2009，JPO＆INPIT
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公开(公告)号：JP2008192557A
公开(公告)日：2008-08-21
申请号：JP2007028153
申请日：2007-02-07
Applicant: Shimadzu Corp , 株式会社島津製作所
Inventor： FURUHASHI OSAMU , HARADA TAKAHIRO , OGAWA KIYOSHI , TANAKA KOICHI
CPC classification number: H01J49/0059
Abstract: PROBLEM TO BE SOLVED: To restrain reduction of signal strength of a mass spectrometer/spectrum of the mass spectrometer so that a primary fragment ion generated with photodissociation is secondarily dissociated.
SOLUTION: An exciting laser beam for triggering photodissociation is irradiated on the center of a capturing zone A in an ion trap 1, and an exciting signal for making the fragment ion excite without exciting a precursor ion is applied on end cap electrodes 12 and 13. Dissociation of the precursor ion effectively starts by receiving irradiation of the exciting laser beam because the selected precursor ion is gathered in the vicinity of the center of the capturing zone A. The fragment ion dislocates an exciting beam irradiation zone B due to greater vibration so that the generated fragment ion is immediately excited with the exciting signal by an action of an exciting electric field. Thus, the fragment ion is hard to receive the exciting laser beam, and therefore, secondary dissociation of the fragment ion is hardly generated.
COPYRIGHT: (C)2008,JPO&INPITAbstract translation: 要解决的问题：为了抑制质谱仪/质谱仪的信号强度的降低，使得通过光解作用产生的一次碎片离子二次解离。 解决方案：用于触发光离解的激发激光束被照射在离子阱1中的捕获区A的中心，并且用于使碎片离子激发而不激发前体离子的激励信号施加在端帽电极12上 由于所选择的前体离子聚集在捕获区域A的中心附近，所以前体离子的离解有效地通过接收激发激光束的照射开始。碎片离子由于更大的位置而使激光束照射区域B位错 使得产生的碎片离子通过激励电场的作用立即被激发信号激发。 因此，碎片离子难以接受激发激光束，因此几乎不产生碎片离子的二次解离。 版权所有（C）2008，JPO＆INPIT
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公开(公告)号：JP2006185828A
公开(公告)日：2006-07-13
申请号：JP2004380049
申请日：2004-12-28
Applicant: SHIMADZU CORP
Inventor： HARADA TAKAHIRO
Abstract: PROBLEM TO BE SOLVED: To miniaturize a time-of-flight mass spectroscope of a type irradiating laser light on a sample 'a' coated on a sample plate 1 to ionize it, and detecting ion by an ion detector (a micro-channel plate) d, after pulling the ion out with a field gradient formed by an electrode 2 and letting it freely fly. SOLUTION: In the time-of-flight mass spectroscope, at least either the sample plate 1 or the electrode 2 is structured to be convex-shaped toward an analyzing room. When the ion flies in the analyzing room, it can be made dispersed in a direction vertical to its flight direction, and therefore, the ion can be prevented from being centered on a part of the detector even when an interval between the electrode 2 and the detector d is shortened, whereby, downsizing of the spectroscope as a whole can be realized. COPYRIGHT: (C)2006,JPO&NCIPI
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Patent Agency Ranking
公开(公告)号：JP2005259400A
公开(公告)日：2005-09-22
申请号：JP2004066605
申请日：2004-03-10
Applicant: Shimadzu Corp , 株式会社島津製作所
Inventor： HARADA TAKAHIRO
CPC classification number: H01J49/167
Abstract: PROBLEM TO BE SOLVED: To provide a mass spectrometer, with an ion source which is excellent in the coaxiality of an air sending passage with a liquid sending pipe by guiding the liquid sending pipe to the center axis of the air sending passage precisely.
SOLUTION: An ion source 11 comprises: a transportation pipe 14, which has a jet tip 16 on the top, where a gas sending passage 17 for sending an assist gas is formed in the jet tip 16, and the inner surface of the gas sending passage 17 near the jet tip 16 forms a tapered surface 5 the space diameter surrounded by which tapers toward the side of the jet tip 16; a liquid sending pipe 15, which is inserted into the gas sending passage 17, is placed with the top toward the jet tip 16, and sends a liquid sample to the jet tip 16; at least three spheres 2 with the same shape inserted between the inner surface of the gas sending passage 17 and the outer surface of the liquid sending pipe 15; and pushing mechanisms 3, 4 which pushes the spheres 2 onto the tapered surface 5.
COPYRIGHT: (C)2005,JPO&NCIPIAbstract translation: 要解决的问题：提供一种质谱仪，其具有通过将送液管精确地引导到送风通道的中心轴线而使送气通道与送液管的同轴度优异的离子源 。 解决方案：离子源11包括：输送管14，其顶部具有喷射头16，其中在喷嘴16中形成有用于发送辅助气体的气体输送通道17， 在喷嘴16附近的气体输送通道17形成锥形表面5，该锥形表面5被包围的空间直径朝向喷嘴16的侧面逐渐变细; 插入到送气通道17中的送液管15的顶部朝向喷嘴16放置，并将液体样品送到喷嘴16; 在气体输送通道17的内表面和送液管15的外表面之间插入相同形状的至少三个球体2; 以及将球体2推到锥形表面5上的推动机构3,4。（C）2005年，JPO＆NCIPI
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公开(公告)号：JP2005026159A
公开(公告)日：2005-01-27
申请号：JP2003192255
申请日：2003-07-04
Applicant: Shimadzu Corp , 株式会社島津製作所
Inventor： TAKEUCHI SADAO , HARADA TAKAHIRO , INOUE FUJIO
Abstract: PROBLEM TO BE SOLVED: To provide a mass spectrometer equipped with a means capable of facilitating the ionization of a sample by sufficiently removing a solvent from droplets containing the sample formed of mist without changing its nature, and having high detection sensitivity.
SOLUTION: This mass spectrometer is used for analyzing the sample by introducing, into a mass spectrometry part from fine pores, the droplets containing ions of the sample generated by spraying a sample solution into an atomization chamber. The solvent is evaporated by irradiating the droplets with light including an infrared ray after the sample solution is sprayed into the atomization chamber and before the droplets are introduced into the mass spectrometry part.
COPYRIGHT: (C)2005,JPO&NCIPIAbstract translation: 要解决的问题：提供一种质谱仪，其配备有能够通过从包含由雾形成的样品的液滴中充分除去溶剂而促进样品电离而不改变其性质并具有高检测灵敏度的装置。
解决方案：该质谱仪用于通过将样品溶液喷射到雾化室中而产生的样品中含有样品的离子的微细孔中的质量分数部分中分析样品。 在将样品溶液喷雾到雾化室中之后并且在将液滴引入质谱部分之前，通过用包括红外线的光照射液滴来蒸发溶剂。 版权所有（C）2005，JPO＆NCIPI
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公开(公告)号：JP2001218755A
公开(公告)日：2001-08-14
申请号：JP2000033616
申请日：2000-02-10
Applicant: SHIMADZU CORP
Inventor： KONISHI IKUO , HARADA TAKAHIRO
IPC: A61B5/145 , A61B5/1455 , G01N21/17 , G01N21/27 , G01N33/72
Abstract: PROBLEM TO BE SOLVED: To adjust the output signal value of a photodetection part to an appropriate size without the need of a large-sized driving part and to obtain a high measurement speed and high measurement accuracy. SOLUTION: The changeover of the incidence/non-incidence of light to the respective photodetection parts or the adjustment of the intensity of the light to the respective photodetection parts is performed by a reflection type optical modulator, and by using the reflection type optical modulator constituted by integrating plural optical reflection elements on a semiconductor chip, miniaturization is performed and the high measurement speed and measurement accuracy are obtained. Also, in the drive of the reflection type optical modulator, by making the adjustment of the reflection angle of the optical reflection elements correspond to an irradiation part, the high measurement accuracy is obtained. This optical measurement device for irradiating a testee body with the light and measuring the light discharged to the outside after being transmitted and/or reflected in the testee body is provided with the irradiation part for irradiating the testee body with the light, a light reception part for receiving and detecting the discharged light and the reflection type optical modulator provided with the plural optical reflection elements integrated on the semiconductor chip. The reflection angle of the optical reflection elements is adjusted corresponding to the irradiation state of the irradiation part.
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公开(公告)号：JP2001013063A
公开(公告)日：2001-01-19
申请号：JP18773799
申请日：1999-07-01
Applicant: SHIMADZU CORP
Inventor： TSUNASAWA YOSHIO , ODA ICHIRO , TAKEUCHI SADAO , ITO YASUNOBU , SAKAUCHI HISAFUMI , KOBAYASHI MANAMI , HARADA TAKAHIRO
IPC: A61B5/145 , A61B5/1455 , G01N21/17
Abstract: PROBLEM TO BE SOLVED: To obtain a photometric apparatus in which the position and the combination of light sending points and/or light receiving points operated simultaneously in the measurement of a plurality of parts on a specimen are changed without changing the connection of a light source of a wiring, of which measuring time is shortened and of which S/N ratio is enhanced. SOLUTION: In this photometric apparatus, a specimen 10 is irradiated with light, and light which is emitted to the outside after being transmitted through the specimen and/or after being reflected by the specimen is measured. The photometric apparatus is constituted in such a way that it is provided with a light sending and receiving part 11 which is provided with a plurality of light sending parts 12 used to shine the light at the specimen and which is provided with a plurality of light receiving parts 13 used to receive the emitted light and that it is provided with a computing and control part which controls the sending and receiving operation of the light with reference to the light sending and receiving parts 11. The computing and control part is provided with a plurality of control tables which decide the combination and the order of the light sending parts and/or the light receiving parts used to perform the sending and receiving operation of the light, and it controls the sending and receiving operation of the light according to the combination and the order of the light sending parts and/or the light receiving parts in the selected control tables.
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公开(公告)号：JP2011169740A
公开(公告)日：2011-09-01
申请号：JP2010033731
申请日：2010-02-18
Applicant: Shimadzu Corp , 株式会社島津製作所
Inventor： IKEGAMI MASAHIRO , HARADA TAKAHIRO
CPC classification number: H01J49/0004 , H01J49/0009
Abstract: PROBLEM TO BE SOLVED: To accurately detect displacement without using a sample plate specially processed when the sample plate is placed on a stage after a matrix is attached, correct the displacement, and implement a correct mass spectrometric analysis of an area designated by an analyst. SOLUTION: When the sample plate 3 is placed on the sample stage 2, an irradiation sign formation control part 22 timely moves the sample stage 2, irradiates the sample plate 3 with a high power laser light in a short time, and forms an irradiation sign at a predetermined position on the sample plate 3. Since the irradiation sign has a unique shape, a microscopic observation image of the irradiation sign is obtained, and saved in an image saving part 32. After the sample plate 3 extracted from the stage 2 is placed on the stage 2 again, the displacement quantity is calculated from a difference between the position of the irradiation sign on the image obtained at the time and the position of the irradiation sign on the image saved in the saving part 32. An analysis position correcting part 24 corrects position information on the area designated by the analyst in response to the found the displacement quantity. COPYRIGHT: (C)2011,JPO&INPIT
Abstract translation: 要解决的问题：为了在安装基体后将样品板放置在载物台上时特别加工的样品板精确检测位移，校正位移，并进行正确的质谱分析，由 分析师。 解决方案：当样品板3放置在样品台2上时，照射信号形成控制部22及时移动样品台2，在短时间内用高功率激光照射样品板3，形成 在样品板3上的预定位置处的照射信号。由于照射标志具有独特的形状，因此获得照射标志的显微镜观察图像，并将其保存在图像保存部32中。在从 再次将载物台2放置在载物台2上，根据当时获得的图像上的照射标志的位置与保存在保存部分32中的图像上的照射标志的位置之间的差异来计算位移量。 响应于发现位移量，分析位置校正部分24校正由分析者指定的区域上的位置信息。 版权所有（C）2011，JPO＆INPIT
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