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公开(公告)号：DE3683437D1
公开(公告)日：1992-02-27
申请号：DE3683437
申请日：1986-10-03
Applicant: SHIMADZU CORP
Inventor： SHIMOMURA TEIICHI , ISHIKAWA KUNIO
Abstract: An optical power meter system comprises a chopper (8) with a semicircle total reflection mirror (6) along an incident light path, two photo-detectors (10,12) of the different characteristics of wavelength sensitivity, and a comparator (26) for comparing the photo-detection signals derived from the two photo-detectors and for outputting an optical detection signal of a higher level. The photo-detectors (10,12) are positioned in a first path of the light passing beside the chopper and a second path of the light reflected by the chopper, respectively. The comparator may be replaced by an adder for adding the photo-detection signals derived from the two photo-detectors.
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公开(公告)号：JPH01242929A
公开(公告)日：1989-09-27
申请号：JP7027788
申请日：1988-03-24
Applicant: SHIMADZU CORP
Inventor： ISHIKAWA KUNIO
Abstract: PURPOSE:To take a light wave analysis of an extremely small spectrum without performing any precise control by a single spectroscope at all by diffracting incident light spectrally by spectroscopes which each have a couple of an incidence part and a projection part in specific relation. CONSTITUTION:A diffraction grating spectroscope 1 which has a couple of incidence parts 1A and 1B and a couple of projection parts 1A and 1B for image formation points of light beams entered by the incidence parts 1A' and 1B' at symmetrical positions to the optical axis of an incidence slit about on optical axis 14 diffracts the light beams incident on the incidence parts 1A and 1B by a diffraction grating 11, and light projected by one of the projection parts 1A' and 1B' of the diffraction grating spectroscope 1 is intermitted by an optical chopper 3 to generate a light signal, which is entered again into one of the incidence parts 1A and 1B of the diffraction grating spectroscope 1 and diffracted spectrally. Then, the light projected by the projection part 1B' of the diffraction grating spectroscope 1 is converted by a photodetector 4 into an electric signal, and then a synchronous detecting circuit 5 detects only a light signal synchronized with the intermittence period of the optical chopper 3 to output an analysis result. Consequently, a light wave analysis of the spectrum is taken without any precise control by a single spectroscope.
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公开(公告)号：JPS6283625A
公开(公告)日：1987-04-17
申请号：JP22457685
申请日：1985-10-08
Applicant: SHIMADZU CORP
Inventor： ISHIKAWA KUNIO , SHIMOMURA TEIICHI
Abstract: PURPOSE:To measure with high efficiency optical signal power in a wide range, by dividing an irradiated light beam into 2 light paths, installing optical detectors of different wave-length sensitivity characteristics respectively and allowing selective output of the detecting output of the larger size to be executed. CONSTITUTION:A light beam transferred by an optical fiber 2 is guided to a chopper 4 and a beam after passing through the chopper 4 is received by an optical detector 10 and a beam reflected by the chopper 4 by a detector 12 respectively. Outputs of defectors 10, 12, after respective synchronous detection by synchronous detectors 16, 20, are supplied to individual contact points, 28b, 28c and comparing circuit 26. The circuit 26 compares magnitudes of both optical light detecting signals given by the detector 16, 20 and switches a common contact point 28a to the larger detecting output side among contact points 28b, 28c. Consequently, an optical detecting output from an optical detector provided with wave-length sensitivity appropriate to the wave-length of the received beam of light is issued out from a selecting circuit 24, enabling measurement within a range of both wave-lengths of detector 10, 12. Further, when the circuit 24 is replaced by an adding circuit, equivalent light sensitivity characteristics of detectors 10, 18 can be obtained.
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公开(公告)号：JPH0378921B2
公开(公告)日：1991-12-17
申请号：JP22457685
申请日：1985-10-08
Applicant: SHIMADZU CORP
Inventor： ISHIKAWA KUNIO , SHIMOMURA TEIICHI
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公开(公告)号：JPH02138834A
公开(公告)日：1990-05-28
申请号：JP25447488
申请日：1988-10-07
Applicant: SHIMADZU CORP
Inventor： KIMURA SADASUKE , ISHIKAWA KUNIO
IPC: G01J3/18
Abstract: PURPOSE:To achieve a light wave analysis on a very weak spectrum at a high accuracy by a method wherein light of one optical path branched is turned to a light signal interrupted with a light chopper and the light signal is coupled optically to a light signal initially incident with a spectral analyzer to perform a light spectral analysis by spectral analysis again. CONSTITUTION:Light of one optical path branched is introduced to a light chopper 4 through an optical fiber 81 to be emitted as optical signal interrupted with the light chopper 4. The interrupted light signal is made incident into the other incident section 52 of a photocoupler 5 to couple the light signal interrupted with a light signal from an optical fiber 80 with the photocoupler 5. The coupled light signal is introduced into a diffraction grating spectroscope 1 with an optical fiber 82 again. The interrupted light signal introduced again has a value of a phase shift small sufficiently as compared with a chopping frequency of a light chopper 4. Then, the spectroscope 1 has a light signal interrupted from an incident section 1A while a light signal initially incident from the fiber 80 is made incident. In this manner, the light signal interrupted is emitted 1a through a diffraction grating or the like on incidence, emission and diffraction conditions utterly the same as those of other light signals.
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Patent Agency Ranking
公开(公告)号：JPH11344439A
公开(公告)日：1999-12-14
申请号：JP15255698
申请日：1998-06-02
Applicant: SHIMADZU CORP
Inventor： KACHI TORU , NAKAMURA KENJI , JIKUYA HIROYUKI , ISHIKAWA KUNIO , IWAI NOBUYUKI , TOMINAGA HIDEKI
IPC: G01N21/27
Abstract: PROBLEM TO BE SOLVED: To conduct measurement without pretreatment such as the dilution of a sample and remeasurement even in the case where a detection limit is exceeded in a measurement wavelength for obtaining a high resolution. SOLUTION: This analytical instrument is provided with a light source 1 for measuring absorbance according to a plurality of measurement wavelengths and a photometry part 3 including a light detection means 4. Then, the photometry part 3 is provided with a plurality of calibration curves for obtaining a sample concentration from the absorbance by making different the measurement wavelengths and concentration ranges, and at the same time selects a measurement wavelength from a plurality of measurement wavelengths, and selects a calibration curve corresponding to the selected measurement wavelength from a plurality of calibration curves, and obtains a sample concentration corresponding to the absorbence according to the selected measurement wavelength based on the measurement calibration curve. By measuring absorbence at a plurality of wavelengths and detecting concentration by using calibration curves with different measurement wavelengths, concentration is measured always in the inside of the detection boundary of the measurement part, thus the pretreatment and remeasurement of the dilution or the like of a sample which are generated the concentration of the measurement sample exceeding the measurement boundary at a high resolution wavelength can be avoided.
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公开(公告)号：JPH0285729A
公开(公告)日：1990-03-27
申请号：JP23715388
申请日：1988-09-21
Applicant: SHIMADZU CORP
Inventor： KIMURA SADASUKE , ISHIKAWA KUNIO , UEMURA MITSUNORI
IPC: G01J3/18
Abstract: PURPOSE:To efficiently measure secondary diffracted light by providing plural sets of an exit slit and detector to one diffraction grating. CONSTITUTION:Light from an entrance slit 1 are diffracted by a diffraction grating 7 after the light are changed to parallel beam by means of a collimator mirror 2. Diffracted light 13 are reflected by a telemeter mirror 3 and converged to the position of an exit slit 5 and diffracted light 14 are reflected by another telemeter mirror 4 and converged to the position of another exit slit 6. The light passed through the slit 5 are detected by means of a detector 8 through a filter 10, but only primary diffracted light are detected by a synergetic effect with the filter 10 which cuts off secondary or higher diffracted light. On the other hand, the light passed through the exit slit 6 are detected with a detector 9 through a filter 11. The detector 9 mainly detects secondary diffracted light by a synergetic effect with the filter 11 which cuts off high-order diffracted light of higher than the tertiary order. Moreover, the positional relations among the mirrors 2-4, slits 5 and 6, and grating 7 are fixed and wavelength scanning is performed by rotating the grating 7.
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公开(公告)号：JP2550650B2
公开(公告)日：1996-11-06
申请号：JP7027788
申请日：1988-03-24
Applicant: SHIMADZU CORP
Inventor： ISHIKAWA KUNIO
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公开(公告)号：JPH0529658A
公开(公告)日：1993-02-05
申请号：JP20612791
申请日：1991-07-24
Applicant: SHIMADZU CORP
Inventor： ANO HIROSHI , ISHIKAWA KUNIO
Abstract: PURPOSE:To suppress power consumption in a current control circuit in case of performing current control of a plurality of LED or LD. CONSTITUTION:LD 11, 12,... are in series connected to a load of a current source to be composed of a transistor 7, a resistance 8, an operation amplifier 9. Phototransistors of the photocouplers 1, 22,... are in parallel connected to the respective LD. Luminous output of the respective LD is incident on PD 51, 52,... and compared with the reference power supply 41, 42,... in order to control the photocouplers by output difference.
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公开(公告)号：JPS6295429A
公开(公告)日：1987-05-01
申请号：JP23612285
申请日：1985-10-21
Applicant: SHIMADZU CORP
Inventor： ISHIKAWA KUNIO , HASHIZUME SHOJIRO , SHIMOMURA TEIICHI
Abstract: PURPOSE:To improve an SN ratio and to eliminate the influence of a dark current generated in a photodetector and a temperature drift generated by an amplifier by switching optical paths by using a chopper composed of a total reflecting mirror. CONSTITUTION:The chopper 14 arranged on the projection optical path C from the exit slit 12 of a spectroscope 2 is constituted by arranging a semicircular total reflecting mirror at 45 deg. to the light projection optical path C. Then, this chopper 14 is rotated at a high speed to switch the optical path to passing light and reflected light alternately while the projection light from the spectrometer 2 is chopped. Consequently, the spectra of two degrees of primary diffracted light and secondary diffracted light within a diffracted light wavelength range are measured at the same time by making a wavelength scan once.
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