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公开(公告)号：JPH0572058B2
公开(公告)日：1993-10-08
申请号：JP6479784
申请日：1984-03-30
Applicant: SHIMADZU CORP
Inventor： KURATANI JUICHI , TAKEDA TAKEHIRO
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公开(公告)号：JPS62206759A
公开(公告)日：1987-09-11
申请号：JP4713886
申请日：1986-03-04
Applicant: SHIMADZU CORP
Inventor： SHIMIZU KIYOSHI , TAKEDA TAKEHIRO
Abstract: PURPOSE:To reduce the analysis time when plural analysis methods are applied simultaneously, by making it possible to carry out plural types of mass analysis methods continuously. CONSTITUTION:At first, the density of a magnetic field B is set at a standard mass M by a standard ion accelerating voltage. This density of the magnetic field is taken as B0. Then a mass analysis order is input to the CPU to carry out MIKES methods, taking detected fragment ion masses M1 and M2 as parent ions, and to carry out MIKES-MF method, taking daughter ions Md1 and Md2. After that, the MF mode is selected and the analysis is started. Then the ion accelerating voltage is converted to set to M1 and M2 while the density of magnetic field B0 is fixed. At the same time, the voltage of the energy analysis electric field is converted synchronously to the ion accelerating voltage. In such a way, when plural analysis methods are applied at a time, the analysis time can be reduced.
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公开(公告)号：JPS62168331A
公开(公告)日：1987-07-24
申请号：JP28707885
申请日：1985-12-20
Applicant: SHIMADZU CORP
Inventor： KUBODERA TOSHIYA , TAKEDA TAKEHIRO
Abstract: PURPOSE:To simplify the putting in and out works of a collision chamber and shorten the time of evacuation, by installing a slit and the collision chamber side by side on a same base plate, and making the base plate slide in a direction vertical to the orbit of ions from the outside of a vacuum receptacle. CONSTITUTION:A collision chamber (C) is installed on a base plate (P) beside a slit (S). The collision chamber is one box, and its front and rear walls in an ion transmission direction are provided with openings (a) through which ions are able to be transmitted, so that a gas for activating the cillision can be introduced. Then, either the slit (S) or the collision chamber (C) can be located on the orbit (Ob) of ions, by sliding the base plate (P). Thus, they can be switched simply and quickly, and the vacuum of a mass spectrograph is not broken, so that the time of evacuation can be shortened.
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公开(公告)号：JPS6264042A
公开(公告)日：1987-03-20
申请号：JP20415885
申请日：1985-09-13
Applicant: SHIMADZU CORP
Inventor： MIISHI KOZO , SHIMAZU KOZO , KURATANI YUICHI , TAKEDA TAKEHIRO , KUBODERA TOSHIYA
Abstract: PURPOSE:To enable easy maintenance, long life of a scintillator and measurement in a wide dynamic range, by providing the scintillator near the last stage of a secondary electron multiplier and selecting two measurement modes, high sensitivity mode and normal measurement mode. CONSTITUTION:Mode 1 is selected by operating switches S1-S3 to disconnect a dynode Dyn at the last stage from a dividing resistor and connect it to an amplifier 38, in order to amplify ion current incident on Dy1 and feed it to a signal processing circuit. Voltage -Vs is impressed from a high voltage power soppy 34 on the metal film 24 of a scintillator 22 to repel electrons emitted from Dyn. In the case of mode 2, switches S1-S3 are placed on 'a'- contact side with voltage -Vd impressed on Dy1 from a high voltage power supply 32 and divided voltages impressed respectively on Dy1-Dyn. Voltage +Vs is impressed on the scintillator 22 by the power supply 34 to accelerate incident ion current, which has been amplified an Dy1-Dyn, and convert it into photons which are then fed to amplifier 38 via a photomultiplier 30.
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公开(公告)号：JPS61128455A
公开(公告)日：1986-06-16
申请号：JP24993884
申请日：1984-11-26
Applicant: Shimadzu Corp
Inventor： KUBODERA TOSHIYA , TAKEDA TAKEHIRO
CPC classification number: H01J49/02 , H01J49/326
Abstract: PURPOSE:To easily establish switching between common mass analysis and analysis of ion split reaction caused by collision activation by slidably moving an integrally coupled ion source slit and collision chamber in the direction crossing with the ion track. CONSTITUTION:A double convergence mass analyzer capable of analyzing ion split reaction caused by collision activation by a linked scan method is formed so that an integrally coupled collision chamber CC and ion source slit Si can be slidably moved in the arrow mark A direction, perpendicular to an ion track O. For an ordinary mass analysis, the ion source slit Si is positioned on the track, and on the other hand, for the analysis utilizing the linked scan method of ion split caused by collision activation, the slit Si is withdrawn to position the collision chamber CC on the ion track. Thereby, contamination of the colli sion chamber can be prevented and a process for positioning it can also be omitted.
Abstract translation: 目的：通过在与离子轨道交叉的方向上滑动移动整体耦合的离子源狭缝和碰撞室，容易地建立通常的质量分析和碰撞激活引起的离子分离反应分析。 构成：能够通过连接的扫描方式分析由碰撞激活引起的离子分离反应的双重收敛质量分析器被形成为使得整体耦合的碰撞室CC和离子源狭缝Si能够沿箭头A方向可滑动地移动，垂直于 离子轨道O.对于通常的质量分析，离子源狭缝Si位于轨道上，另一方面，为了利用由碰撞激活引起的离子分裂的链接扫描方法进行分析，将狭缝Si取出到 将碰撞室CC定位在离子轨道上。 由此，可以防止混凝土室的污染，也可以省略对其进行定位的工序。
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Patent Agency Ranking
公开(公告)号：JPS60207052A
公开(公告)日：1985-10-18
申请号：JP6479784
申请日：1984-03-30
Applicant: SHIMADZU CORP
Inventor： KURATANI YUUICHI , TAKEDA TAKEHIRO
Abstract: PURPOSE:To measure the forming elapse of a daughter ion, by performing the intensity of an electric field in matching relation to the daughter ion by a double converging type mass spectrometer and detecting the peak appearing at the position of specific mass. CONSTITUTION:In a reverse arrangement type double converging mass spectrometer, when ion acceleration voltage between an ion source 1 and a magnetic field 2 is set to V0, the energy E0=eV0 of an original parent ion is constant regardless of the mass of the parent ion. Herein, when the parent ion with mass M0 is creavaged and daughter ions with mass M are generated, the voltage of an energy analyzing electric field 3 is set so as to pass an ion with energy E= E0 (M/M0) and the mass scanning of a magnetic field 2 is performed to generate peaks P1, P2 at places of masses M /M0 and M0. The peak P1 is the intensity of daughter ions generated when the creavage of the parent ion is occured before incident to the magnetic field and the peak P2 is the intensity of daughter ions formed between the magnetic field and the electric field. As mentioned above, the formation of daughter ions can be detected and quantitatively measured by one scanning of the magnetic field.
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公开(公告)号：JPS60165034A
公开(公告)日：1985-08-28
申请号：JP2122684
申请日：1984-02-07
Applicant: SHIMADZU CORP
Inventor： TAKEDA TAKEHIRO , KURATANI YUUICHI
Abstract: PURPOSE:To improve detection sensibility of CA ions by making it possible to regulate the position along the ion orbit surface while in the orthogonal direction to the ion orbit as well as the inclination around the axis vertical to the ion orbit surface in an analyzing device of a collision chamber by external operation. CONSTITUTION:A collision chamber CC is finely adjustable in the Y-direction orthogonal to the ion orbit inside the ion orbit surface while being minutely rotatable around the Z-axis vertical to the ion orbit surface. When only an incident hole Si is accorded with the center of an ion beam Ib by moving the collision chamber in the Y-direction, the ions being incident to the collision chamber are increased but the split ions in the same direction hit on the periphery of the outgoing hole So thus lowering the outgoing efficiency of ions. By adjusting the position of the collision chamber in the Y-direction together with adjusting the inclination around the Z-axis, the ion incident and outgoing efficiency can be hightened by almost 100%.
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公开(公告)号：JPH09292369A
公开(公告)日：1997-11-11
申请号：JP13111296
申请日：1996-04-26
Applicant: SHIMADZU CORP
Inventor： TAKEDA TAKEHIRO
Abstract: PROBLEM TO BE SOLVED: To provide an apparatus which can measure the diameter of neutral particles, wheeas the conventional particle diameter measuring apparatus could only measure the diameter of ions. SOLUTION: Intended ions are separated from ions produced by an ionizing section IS, by a mass spectrometer MS1 according to the mass/charge ratios. The separated ions are converted into neutral particles at a neutralizing section NC to be admitted into an collision chamber CC where a collision gas is held. Then, the intensity of the particles traveling straight without colliding with the gas is detected. The intensity depends on the probability of colliding, and the probability of the collision depends on the diameter of the particles. This enables calculation of the diameter of the particles from the detected intensity value.
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公开(公告)号：JPH0831371A
公开(公告)日：1996-02-02
申请号：JP16386794
申请日：1994-07-15
Applicant: SHIMADZU CORP
Inventor： NISHI NOBUHIKO , TAKEDA TAKEHIRO
Abstract: PURPOSE:To provide an ICP/MS (inductively coupled plasma/mass-spectrometer) with which the sensing sensitivity is enhanced by heightening the ion transmitting efficiency. CONSTITUTION:An inert gas jetting means 9 is furnished between an inductively coupled plasma torch 2 and a sampling orifice 4, and an inert gas is jetted to the center of the plasma 3 produced by the torch 2. The torch 3 is configured as a three-fold tubing consisting of a carrier gas pipeline 2a situated internally through which a sample is introduced, an intermediate pipeline 2b through which a plasma gas is supplied, and an outer pipeline 2c through which a coolant gas to cool the torch 2 flows, wherein the foremost of the coolant gas pipeline 2c is throttled inward so that the coolant gas is deflected toward the center of the plasma 3.
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公开(公告)号：JPH0560057B2
公开(公告)日：1993-09-01
申请号：JP11194984
申请日：1984-05-31
Applicant: SHIMADZU CORP
Inventor： ISHIDA MASARU , TAKEDA TAKEHIRO
IPC: G01N23/225 , G01N27/62 , H01J49/02 , H01J49/32
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