中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

5 records (took 0.026 seconds)

    SYSTEM AND METHOD OF TESTING HIGH BRIGHTNESS LED (HBLED)
    3.
    发明专利
    SYSTEM AND METHOD OF TESTING HIGH BRIGHTNESS LED (HBLED) 未知

    公开(公告)号：CA2770366C

    公开(公告)日：2019-01-22

    申请号：CA2770366

    申请日：2010-07-29

    Applicant: SOF TEK INTEGRATORS INC DBA OP TEST

    Inventor： MORROW DANIEL CREIGHTON ,  DUMMER JONATHAN LEIGH

    IPC: G01R31/00 ,  G01R31/26

    Abstract: A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (OUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences, a Parametpc Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED

    SYSTEM AND METHOD OF QUANTIFYING COLOR AND INTENSITY OF LIGHT SOURCES
    4.
    发明专利
    SYSTEM AND METHOD OF QUANTIFYING COLOR AND INTENSITY OF LIGHT SOURCES 未知

    公开(公告)号：CA2807576C

    公开(公告)日：2019-10-15

    申请号：CA2807576

    申请日：2011-08-09

    Applicant: SOF TEK INTEGRATORS INC DBA OP TEST

    Inventor： MORROW DANIEL CREIGHTON ,  DUMMER JONATHAN LEIGH

    IPC: G01R31/265 ,  H01L21/66

    Abstract: A system and method of quantifying color and intensity of light sources including LEDs, High Brightness LEDs, and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided. In one embodiment, a method of characterizing a SSL source includes a SSL source under test, a Spectral Power Distribution of light emission of the SSL source, a curve-fitting function, a set of configuration data comprising the order of the curve-fitting function, the number of nodes, wavelength boundary limits, saturation threshold, and noise floor threshold, a computing device for curve-fitting, node detection, iteration and program control and inputting and outputting data; and a set of C-Parameters, noise parameters, and confidence values. A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided. In one embodiment, a method of characterizing a Solid State Light (SSL) source includes a SSL source under test (DUT), a Spectral Power Distribution (SPD) of light emission of the SSL source, a curve-fitting function, a set of configuration data comprising the order of the curve-fitting function, the number of nodes, wavelength boundary limits, saturation threshold, and noise floor threshold, a computing device for curve-fitting, node detection, iteration and program control and inputting and outputting data; and a set of C-Parameters, noise parameters, and confidence values.

    SYSTEM AND METHOD OF QUANTIFYING COLOR AND INTENSITY OF LIGHT SOURCES
    5.
    发明专利
    SYSTEM AND METHOD OF QUANTIFYING COLOR AND INTENSITY OF LIGHT SOURCES 未知

    公开(公告)号：CA2807576A1

    公开(公告)日：2012-02-16

    申请号：CA2807576

    申请日：2011-08-09

    Applicant: SOF TEK INTEGRATORS INC DBA OP TEST

    Inventor： MORROW DANIEL CREIGHTON ,  DUMMER JONATHAN LEIGH

    IPC: G01J1/42

    Abstract: A system and method of quantifying color and intensity of light sources including LEDs, High Brightness LEDs, and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided. In one embodiment, a method of characterizing a SSL source includes a SSL source under test, a Spectral Power Distribution of light emission of the SSL source, a curve-fitting function, a set of configuration data comprising the order of the curve-fitting function, the number of nodes, wavelength boundary limits, saturation threshold, and noise floor threshold, a computing device for curve-fitting, node detection, iteration and program control and inputting and outputting data; and a set of C-Parameters, noise parameters, and confidence values. A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided. In one embodiment, a method of characterizing a Solid State Light (SSL) source includes a SSL source under test (DUT), a Spectral Power Distribution (SPD) of light emission of the SSL source, a curve-fitting function, a set of configuration data comprising the order of the curve-fitting function, the number of nodes, wavelength boundary limits, saturation threshold, and noise floor threshold, a computing device for curve-fitting, node detection, iteration and program control and inputting and outputting data; and a set of C-Parameters, noise parameters, and confidence values.

Patent Agency Ranking