METHOD AND APPARATUS FOR FULL PHASE INTERFEROMETRY
    2.
    发明申请
    METHOD AND APPARATUS FOR FULL PHASE INTERFEROMETRY 审中-公开
    用于完全相位干涉的方法和装置

    公开(公告)号:WO2006127952A3

    公开(公告)日:2007-07-19

    申请号:PCT/US2006020346

    申请日:2006-05-23

    Abstract: An apparatus and method for differential spectral interferometry comprising providing an interferometer comprising a light source; employing an element to provide a dithered relative phase shift between target and reference arms of the interferometer, detecting output from the interferometer, demodulating signals received from the detector at different multiples of the dither frequencies, generating more than one real-valued interferograms from demodulated signals, and using the real- valued interferograms to obtain the complex spectral interferogram.

    Abstract translation: 一种用于差分光谱干涉测量的装置和方法,包括提供包括光源的干涉仪; 使用元件在干涉仪的目标和参考臂之间提供抖动的相对相移,检测来自干涉仪的输出,解调从抖动频率的不同倍数从检测器接收的信号,从解调信号产生多于一个的实数干涉图 ,并使用实数干涉图来获得复杂的光谱干涉图。

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