公开(公告)号：DE60316068T2

公开(公告)日：2008-06-05

申请号：DE60316068

申请日：2003-05-12

Applicant: ST MICROELECTRONICS PVT LTD

Inventor： PATHAK SHALINI ,  SWAMI PARVESH

IPC: G01R31/3185 ,  G06F11/10 ,  G11C29/00 ,  G11C29/02 ,  G11C29/12

Abstract: A Programmable Logic Device (PLD) incorporating the ability to test the configuration memory either independently or during configuration, comprising a selector for selecting a particular column or row of the configuration memory array, an input data store for storing configuration data required to be stored in the selected column or row, or test data for testing the selected column or row, an output data store for storing the output from the selected column or row, and test logic that provides control signals for verifying the correct operation of the data lines of the configuration memory array without disturbing the data stored in the memory array.

公开(公告)号：DE60316068D1

公开(公告)日：2007-10-18

申请号：DE60316068

申请日：2003-05-12

Applicant: ST MICROELECTRONICS PVT LTD

Inventor： PATHAK SHALINI ,  SWAMI PARVESH

IPC: G01R31/3185 ,  G06F11/10 ,  G11C29/00 ,  G11C29/02 ,  G11C29/12

Abstract: A Programmable Logic Device (PLD) incorporating the ability to test the configuration memory either independently or during configuration, comprising a selector for selecting a particular column or row of the configuration memory array, an input data store for storing configuration data required to be stored in the selected column or row, or test data for testing the selected column or row, an output data store for storing the output from the selected column or row, and test logic that provides control signals for verifying the correct operation of the data lines of the configuration memory array without disturbing the data stored in the memory array.