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    CONTACTOR FOR TEST OF SMALL-SIZE SEMICONDUCTOR DEVICE
    1.
    发明专利
    CONTACTOR FOR TEST OF SMALL-SIZE SEMICONDUCTOR DEVICE 失效

    公开(公告)号：JPH0755880A

    公开(公告)日：1995-03-03

    申请号：JP4408194

    申请日：1994-03-15

    Applicant: ST MICROELECTRONICS SRL

    Inventor： PEREGO ROMANO

    IPC: G01R1/073 ,  G01R1/04 ,  G01R31/26 ,  H01L21/66 ,  H05K7/10

    Abstract: PURPOSE: To enable juxtaposition of detecting forcing contacts making a pair of first and second electrical contact elements placed on a back plate form the Kelvin electric contacts of a semiconductor device by combining with an electrical contact element. CONSTITUTION: The contactor 1 has a plate 2 and a back plate 3 and is made from an electrically insulating material. First electrical contact element 8 is mounted on the plate 2, installed on arrays along two sides of a housing, and individually corresponds to the lead wires L of a semiconductor device D to be tested. Also, the element 8 is spring-loaded by the plate 2 by means of its own arched part and is biased toward the lead wire L of the device D placed within the housing. Second electrical contact element 10 is mounted on the plate 2 and placed near the element 8. The element 8 combine with the element 10 and an electrical connecting element 12 to form Kelvin type contacts. The elements 8 work as forcing contacts, and the elements 10 as detecting contacts.

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