Abstract:
An associative memory comprises an array of memory cells arranged in rows and columns, each row comprising a plurality of segments each of which comprises a set of said memory cells, wherein each memory cell has compare circuitry for comparing input data with data stored therein and for generating a cell match signal when said input data matches said stored data and match signal combining circuitry for receiving a match signal from a preceding cell in the set and operable to generate a logical value dependent on the match signal of the current cell and the match signal of the preceding cell whereby each segment generates a resultant segment logical value, the memory further comprising combinatorial logic circuitry associated with each row for combining said resultant segment logical values to generate a final output match signal for that row.
Abstract:
The present invention proposes a method of disabling a particular decoder output during scan-mode testing without impacting the critical path during either scan-mode or the normal mode of operation. During scan-mode testing a known bit stream may be programmed into latches and provides a means of functional testing the device in question. Three embodiments are used in conjunction with a disable driver to pull an intermediate node HIGH. The intermediate node is inverted by an output driver, which disables the relevant decoder output. The first embodiment involves using a full CMOS gate, the second embodiment uses ratio logic and the third uses a weak pull-up resistor.
Abstract:
A comparator circuit with comparing means for comparing first and second voltages, has current source circuitry for providing current to said comparing means, said current source circuitry having an input for receiving a clock signal having first and second states, whereby the comparing means starts to compare the first and second voltages when the clock signal makes a transition from the first state to the second state; and means for determining when said comparing means has completed a comparison of said first and second voltages and for switching off said current source circuitry and hence said comparing means when said comparison has been completed.
Abstract:
A comparator circuit with comparing means for comparing first and second voltages, has current source circuitry for providing current to said comparing means, said current source circuitry having an input for receiving a clock signal having first and second states, whereby the comparing means starts to compare the first and second voltages when the clock signal makes a transition from the first state to the second state; and means for determining when said comparing means has completed a comparison of said first and second voltages and for switching off said current source circuitry and hence said comparing means when said comparison has been completed.