公开(公告)号：US12204782B2

公开(公告)日：2025-01-21

申请号：US18337751

申请日：2023-06-20

Applicant: STMicroelectronics International N.V.

Inventor： Urmishkumar Karsanbhai Patel ,  Danish Hasan Syed ,  Prateek Singh

IPC: G06F3/06

Abstract: According to an embodiment, a method for testing and repairing local memory in a hardware accelerator from a one-time programmable memory (OTP) is provided. The method includes asserting a grant signal, a loading of a first repair data for a sub-set of the local memory associated with a main-controller from a first partition of the OTP memory, communicating a status signal after completion of the loading indicating a completion of the loading, and de-asserting the grant signal in response to receiving the status signal.

公开(公告)号：US20240427514A1

公开(公告)日：2024-12-26

申请号：US18337751

申请日：2023-06-20

Applicant: STMicroelectronics International N.V.

Inventor： Urmishkumar Karsanbhai Patel ,  Danish Hasan Syed ,  Prateek Singh

IPC: G06F3/06

Abstract: According to an embodiment, a method for testing and repairing local memory in a hardware accelerator from a one-time programmable memory (OTP) is provided. The method includes asserting a grant signal, a loading of a first repair data for a sub-set of the local memory associated with a main-controller from a first partition of the OTP memory, communicating a status signal after completion of the loading indicating a completion of the loading, and de-asserting the grant signal in response to receiving the status signal.