公开(公告)号：EP1584938B1

公开(公告)日：2008-05-21

申请号：EP04252076.7

申请日：2004-04-07

Applicant: STMicroelectronics Limited

Inventor： Warren, Robert ,  Mills, Robert M.

IPC: G01R31/3185

CPC classification number: G01R31/318552

公开(公告)号：EP1584939A1

公开(公告)日：2005-10-12

申请号：EP04252078.3

申请日：2004-04-07

Applicant: STMicroelectronics Limited

Inventor： Warren, Robert ,  Mills, Robert M.

IPC: G01R31/3185 ,  G01R31/319 ,  G06F1/04

CPC classification number: G01R31/318552

Abstract: An integrated circuit comprising test circuitry, the test circuitry comprising a counter for counting clock signals and having an output for providing a control signal. The counter being arranged to have an internal state, and the counter being arranged to change the control signal on the internal state of counter reaching a predetermined value.

Abstract translation: 一种包括测试电路的集成电路，所述测试电路包括用于对时钟信号进行计数并具有用于提供控制信号的输出的计数器。 计数器被布置成具有内部状态，并且该计数器被布置成在计数器的内部状态上改变控制信号达到预定值。

公开(公告)号：EP1584938A1

公开(公告)日：2005-10-12

申请号：EP04252076.7

申请日：2004-04-07

Applicant: STMicroelectronics Limited

Inventor： Warren, Robert ,  Mills, Robert M.

IPC: G01R31/3185

CPC classification number: G01R31/318552

Abstract: An integrated circuit comprising: functional circuitry; test circuitry connected to the functional circuitry, wherein the test circuitry is arranged to control the testing of the functional circuitry; and clock signal generating circuitry connected to both the functional circuitry and the test circuitry. Wherein the test circuitry is arranged to use the clock signal for testing the functional circuitry.

Abstract translation: 一种集成电路，包括：功能电路; 连接到所述功能电路的测试电路，其中所述测试电路被布置成控制所述功能电路的测试; 以及连接到功能电路和测试电路两者的时钟信号发生电路。 其中测试电路被设置为使用时钟信号来测试功能电路。