Method and apparatus for providing compensation against temperature, process and supply voltage variation
    2.
    发明公开
    Method and apparatus for providing compensation against temperature, process and supply voltage variation 审中-公开
    用于补偿针对温度,电压和制造变化的方法和装置

    公开(公告)号:EP1662660A2

    公开(公告)日:2006-05-31

    申请号:EP05025953.0

    申请日:2005-11-29

    CPC classification number: H03K3/011 H03K3/3565 H03K17/145 H03K19/00384

    Abstract: In the present invention an apparatus and method for providing compensation against temperature, process and supply voltage variation in MOS circuits has been proposed. The invention provides a change in process, temperature and voltage detection circuit, which controls the body bias and the drive of the devices in the CMOS circuit. The detection circuit is independent of any input or internal signal of the CMOS circuit to be controlled.

    Abstract translation: 在本发明的装置和方法,用于提供相对于温度,工艺和MOS电路的电源电压变化补偿已经提出。 本发明提供在过程中,温度和电压检测电路,其控制体偏置并在CMOS电路中的器件的驱动的变化。 检测电路是独立的要被控制的CMOS电路中的任何输入或内部信号。

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