公开(公告)号：EP1791133A1

公开(公告)日：2007-05-30

申请号：EP06124410.9

申请日：2006-11-20

Applicant: STMicroelectronics Pvt. Ltd.

Inventor： Kashyap, Amit ,  Dubey, Prashant ,  Garg, Akhil

IPC: G11C29/48 ,  G11C29/14

CPC classification number: G11C29/48 ,  G11C29/14

Abstract: The present invention relates to a method of sharing testing components for multiple embedded memories and the memory system incorporating the same.
The memory system includes multiple test controllers, multiple interface devices, a main controller, and a serial interface. The main controller is used for initializing testing of each of the dissimilar memory groups using a serial interface and local test controllers. The memory system results in reduced routing congestion and faster testing of plurality of dissimilar memories.

Abstract translation: 本发明涉及到的共享检测部件针对多个嵌入式存储器和存储器系统结合的方法。 该存储器系统包括多个测试控制器，在多个接口设备，主控制器和串行接口。 主控制器用于初始化每个使用串行接口和本地测试控制器异种存储器组的测试。 存储系统能减少布线拥塞和不同的记忆多个测试速度更快。