Packaged digital microphone device with auxiliary line-in function
    2.
    发明公开
    Packaged digital microphone device with auxiliary line-in function 审中-公开
    数码相机Mikrofon mitzusätzlicherEingangsfunktion

    公开(公告)号:EP1565034A1

    公开(公告)日:2005-08-17

    申请号:EP04425098.3

    申请日:2004-02-16

    CPC classification number: H04R1/005 H04R1/04 H04R19/04

    Abstract: The drawbacks of the use of embedded digital microphones in electronic apparatuses is overcome by a digital microphone destined to be embedded in the apparatus that contemplates the presence of an auxiliary line-in terminal or terminals in the packaged digital microphone device, to which a remote analog microphone (MIC2) may be connected.
    The result is that the use of an external (remote) analog microphone (MIC2) does not require a dedicated additional analog-to-digital converter. Such a line-in function may even be duplicated even for more than one external analog microphone.

    Abstract translation: 在电子设备中使用嵌入式数字麦克风的缺点是通过旨在嵌入在设备中的数字麦克风克服,该数字麦克风预期在打包的数字麦克风设备中存在辅助线路输入终端或终端,远程模拟 麦克风(MIC2)可能被连接。 结果是使用外部(远程)模拟麦克风(MIC2)不需要专用的附加模数转换器。 即使对于多于一个的外部模拟麦克风也可能会复制这样的线路输入功能。

    A method of refreshing an electrically erasable and programmable non-volatile memory
    3.
    发明公开
    A method of refreshing an electrically erasable and programmable non-volatile memory 审中-公开
    过程用于在电可擦和可编程的非易失性存储器刷新数据

    公开(公告)号:EP1271552A2

    公开(公告)日:2003-01-02

    申请号:EP02013242.9

    申请日:2002-06-17

    CPC classification number: G11C16/3431 G11C16/3418

    Abstract: A method (1110a;1110b) of refreshing an electrically erasable and programmable non-volatile memory (100) having a plurality of memory cells (Mhk) is proposed. The method includes the steps of: verifying (1106-1114;1152-1162) whether a memory cell has drifted from a correct condition, and individually restoring (1116-1130) the correct condition of the memory cell if the result of the verification is positive.

    Abstract translation: 的方法(1110A; 1110B)的清爽电可擦可编程非易失性存储器(100),具有存储单元(MIC)的数目为提议。 该方法包括下列步骤:验证(1106年至1114年; 1152年至1162年)是否存储器单元已经从一个正确条件漂移,和恢复独立(1116年至1130年)的存储单元的正确状态,如果验证的结果是 阳性。

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