Reading circuit and method for data storage system
    1.
    发明公开
    Reading circuit and method for data storage system 审中-公开
    Leseschaltung und LeseverfahrenfürDatenspeichersystem

    公开(公告)号:EP1944763A1

    公开(公告)日:2008-07-16

    申请号:EP07425012.7

    申请日:2007-01-12

    CPC classification number: G11B9/02 G11C7/067 G11C11/22

    Abstract: Described herein is a reading circuit (10) for reading a datum stored in a storage material (34). In the reading circuit (10), a generating stage (3) generates a read electrical quantity (V r ) to be applied to the storage material (34), and a sensing stage (12) is configured to generate an output electrical quantity (V out ) that is indicative of a charge variation (ΔQ) associated to the datum stored, and that occurs in the storage material (34) due to application of the read electrical quantity (V r ); in particular, the sensing stage uses a charge-sensing amplifier (12) electrically connected to the storage material (34).

    Abstract translation: 这里描述了一种用于读取存储在存储材料(34)中的数据的读取电路(10)。 在读取电路(10)中,生成级(3)生成要施加到存储材料(34)的读取电量(V r),并且感测级(12)被配置为产生输出电量 V out),其指示与存储的数据相关联的电荷变化(“Q”),并且由于应用读取的电量(V r)而在存储材料(34)中发生的电荷变化(“Q”)。 特别地,感测级使用电连接到存储材料(34)的电荷感测放大器(12)。

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