Abstract:
A by-pass device that uses a power MOS transistor but does not need any inductor and thus be fully integrable uses an oscillator and a charge pump circuit supplied through a protection transistor and a control circuit of a driving stage of the gate of the by-pass MOS transistor depending on the sign of the voltage on the nodes of the group of cells in series and of the by-pass MOS transistor and of the charge voltage of a tank capacitor that supplies the control circuit and the driving stage.
Abstract:
The Test Access Port (TAP) functions of a plurality of components arranged on a single chip (10) are managed by selectively driving the TAP function (20, 30, 40) of each of the components with respective clocks (TCK, DCK), whilst the further signals for driving the TAP function (TDI, TDO, TMS, NTRST) are used in shared mode among the various components. Preferably, associated to the aforesaid clocks is a pull-down function for selectively blanking the respective clocks in conditions of non-use. In a preferred way, the aforesaid dedicated clocks (DCK, TCK) are generated on board the chip (10).
Abstract:
A by-pass device that uses a power MOS transistor but does not need any inductor and thus be fully integrable uses an oscillator and a charge pump circuit supplied through a protection transistor and a control circuit of a driving stage of the gate of the by-pass MOS transistor depending on the sign of the voltage on the nodes of the group of cells in series and of the by-pass MOS transistor and of the charge voltage of a tank capacitor that supplies the control circuit and the driving stage.