By-pass diode structure for strings of series connected cells of a photovoltaic panel
    1.
    发明公开
    By-pass diode structure for strings of series connected cells of a photovoltaic panel 无效
    UmleitungsdiodenstrukturfürStrings aus Serien verbundener Zellen einer Photovoltaikplatte

    公开(公告)号:EP2141746A2

    公开(公告)日:2010-01-06

    申请号:EP09163073.1

    申请日:2009-06-18

    Abstract: A by-pass device that uses a power MOS transistor but does not need any inductor and thus be fully integrable uses an oscillator and a charge pump circuit supplied through a protection transistor and a control circuit of a driving stage of the gate of the by-pass MOS transistor depending on the sign of the voltage on the nodes of the group of cells in series and of the by-pass MOS transistor and of the charge voltage of a tank capacitor that supplies the control circuit and the driving stage.

    Abstract translation: 使用功率MOS晶体管但不需要任何电感器并因此完全可积分的旁路器件使用通过保护晶体管提供的振荡器和电荷泵电路以及旁路栅极的驱动级的控制电路, 根据串联的单元组和旁通MOS晶体管的节点上的电压的符号以及提供控制电路和驱动级的储能电容器的充电电压的符号。

    A test access port (TAP) management method and system
    2.
    发明公开
    A test access port (TAP) management method and system 有权
    Verfahren und System zur Verwaltung eines Testzugriffsports

    公开(公告)号:EP1229338A1

    公开(公告)日:2002-08-07

    申请号:EP01830065.7

    申请日:2001-01-31

    Inventor: La Scala, Amedeo

    CPC classification number: G01R31/318505 G01R31/318558

    Abstract: The Test Access Port (TAP) functions of a plurality of components arranged on a single chip (10) are managed by selectively driving the TAP function (20, 30, 40) of each of the components with respective clocks (TCK, DCK), whilst the further signals for driving the TAP function (TDI, TDO, TMS, NTRST) are used in shared mode among the various components. Preferably, associated to the aforesaid clocks is a pull-down function for selectively blanking the respective clocks in conditions of non-use. In a preferred way, the aforesaid dedicated clocks (DCK, TCK) are generated on board the chip (10).

    Abstract translation: 通过用相应的时钟(TCK,DCK)选择性地驱动每个组件的TAP功能(20,30,40)来管理布置在单个芯片(10)上的多个组件的测试访问端口(TAP)功能, 而用于驱动TAP功能(TDI,TDO,TMS,NTRST)的进一步信号在各种组件之间以共享模式使用。 优选地,与上述时钟相关联的是用于在不使用的条件下选择性地消隐各个时钟的下拉功能。 在优选的方式中,上述专用时钟(DCK,TCK)在芯片(10)上产生。

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