Microelectromechanical gyroscope with self-test function and control method of a microelectromechanical gyroscope
    1.
    发明公开
    Microelectromechanical gyroscope with self-test function and control method of a microelectromechanical gyroscope 审中-公开
    微机电Gyroskop mit Selbsttestfunktion und Steuerungverfahren eines microelectromechanical Gyroskops

    公开(公告)号:EP1959233A1

    公开(公告)日:2008-08-20

    申请号:EP07425076.2

    申请日:2007-02-13

    CPC classification number: G01C23/005 G01C19/5726 G01C19/5762

    Abstract: A microelectromechanical gyroscope includes a microstructure (102), comprising a first mass (107) and a second mass (108), wherein the first mass (107) is oscillatable according to a first axis (X) and the second mass (108) is constrained to the first mass (107) so as to be drawn along by the first mass (107) according to the first axis (X) and to oscillate according to a second axis (Y), in response to a rotation (Ω) of the microstructure (102). A driving device (103) is coupled to the microstructure (102) to maintain the first mass (107) in oscillation at the driving frequency (ω R ), and a reading device (104) detects displacements of the second mass (108) according to the second axis (Y). The gyroscope is provided with a self-test actuation system (6d, 6e, 6h, 106) coupled to the second mass (108) for applying an electrostatic force (F E ) at the driving frequency (ω R ) so as to move the second mass (108) according to the second axis (Y).

    Abstract translation: 微机电陀螺仪包括微结构(102),其包括第一质量块(107)和第二质量块(108),其中所述第一质量块(107)可根据第一轴线(X)振荡,所述第二质量块 约束到第一质量(107),以便根据第一轴线(X)沿着第一质量块(107)拉伸,并且响应于第二轴线(Y)的旋转(©),根据第二轴线 微结构(102)。 驱动装置(103)联接到微结构(102)以保持第一质量块(107)在驱动频率(ÉR)处振荡,并且读取装置(104)根据以下步骤检测第二质量块(108)的位移: 到第二轴(Y)。 陀螺仪设置有耦合到第二质量块(108)的自检致动系统(6d,6e,6h,106),用于在驱动频率(ÉR)处施加静电力(FE),以便移动第二 质量(108)根据第二轴(Y)。

Patent Agency Ranking