LIGHT EMITTING DEVICE
    2.
    发明专利

    公开(公告)号:CA2530614A1

    公开(公告)日:2006-06-20

    申请号:CA2530614

    申请日:2005-12-15

    Abstract: A light emitting device having a simple structure that can be easily manufactured, attaining high light emitting efficiency stably for a long tim e is obtained, which light emitting device includes: a GaN substrate as a nitride semiconductor substrate and, on a first main surface of the nitride semiconductor substrat e, an n-type Al x Ga1-x N layer, a p-type Al x Ga1-x N layer positioned further than the n- type Al x Ga1-x N layer viewed from the nitride semiconductor substrate, and a quantum well positioned between the n-type Al x Ga1-x N layer and the p-type Al x Ga1-x N layer. In the light emitting device, specific resistance of the nitride semiconductor substrate is at most 0.5 .OMEGA..cndot.cm, the side of p-type Al x Ga1-x N layer is mounted face-down , and the light is emitted from the second main surface 1a that is opposite to the first main surface o f the nitride semiconductor substrate. The second main surface 1a of nitride semiconductor substrate has trenches formed therein.

    LIGHT EMITTING DEVICE
    4.
    发明专利

    公开(公告)号:CA2488596A1

    公开(公告)日:2005-06-03

    申请号:CA2488596

    申请日:2004-11-30

    Abstract: A light emitting device includes a nitride semiconductor substrate with a resistivity of 0.5 .OMEGA..cndot.cm or less, an n-type nitride semiconductor layer and a p-type nitride semiconductor layer placed more distantly from the nitride semiconductor substrate than the n-type nitride semiconductor layer at a first main surface side of the nitride semiconductor substrate, and a light emitting layer placed between the n-typ e nitride semiconductor layer and the p-type nitride semiconductor layer, wherein one of the nitride semiconductor substrate and the p-type nitride semiconductor layer i s mounted at the top side which emits light and the other is placed at the down side, and a single electrode is placed at the top side. Therefore, there is provided a light emitting device which has a simple configuration thereby making it easy to fabricate, can provide a high light emission efficiency for a long time period, and can be easily miniaturized.

    METHOD AND INSTRUMENT FOR MEASURING IMPURITY CONCENTRATION IN SUBSTRATE

    公开(公告)号:JP2003234388A

    公开(公告)日:2003-08-22

    申请号:JP2002033798

    申请日:2002-02-12

    Inventor: IKEDA AYAKO

    Abstract: PROBLEM TO BE SOLVED: To provide a method of measuring impurity concentration in a substrate improved so that the three-dimensional distribution of impurity density can easily, inexpensively and nondistructively be measured by using a PL intensity measuring instrument capable of measuring an optional place inside of a substrate. SOLUTION: The substrate having a smooth surface is prepared. Laser beams are made to enter the substrate from the smooth surface. The light intensity of photoluminescence light emitted inside the substrate and detected at an upper part is obtained. The impurity concentration in the substrate is obtained from the light intensity of the photoluminescence light. COPYRIGHT: (C)2003,JPO

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