公开(公告)号：DE69406557T2

公开(公告)日：1998-06-25

申请号：DE69406557

申请日：1994-01-13

Applicant: TOA ELECTRONICS

Inventor： AIKAWA KATSUAKI ,  SHIRATAMA TADASHI

IPC: G01J3/457 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/359 ,  G01N33/44 ,  G01J3/42 ,  B07C5/342

Abstract: The method of the present invention comprises the steps of irradiating near-infrated rays to a plastics of an unknown type to measure the NIR spectrum thereof, determining the first-derivative or second-derivative, measuring the differential spectrum at prescribed intervals of wavelength over a region of measurement wavelengths, determining the class of whether the differential spectrum for each measurement wavelength is on the plus-side, minus-side or any other side, comparing the resultant class data with those of previously determined differential spectra for plastics of known types to determine the ratio of agreement between the thus compared data (agreement ratio), and determining that the plastics showing the highest agreement ratio is the type of the plastics of the unknown type. By using the above-mentioned agreement ratio, it is possible to simply and rapidly determine the type of a plastics by means of the differential spectrum of near-infrared rays.

公开(公告)号：DE69406557D1

公开(公告)日：1997-12-11

申请号：DE69406557

申请日：1994-01-13

Applicant: TOA ELECTRONICS

Inventor： AIKAWA KATSUAKI ,  SHIRATAMA TADASHI

IPC: G01J3/457 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/359 ,  G01N33/44 ,  G01J3/42 ,  B07C5/342

Abstract: The method of the present invention comprises the steps of irradiating near-infrated rays to a plastics of an unknown type to measure the NIR spectrum thereof, determining the first-derivative or second-derivative, measuring the differential spectrum at prescribed intervals of wavelength over a region of measurement wavelengths, determining the class of whether the differential spectrum for each measurement wavelength is on the plus-side, minus-side or any other side, comparing the resultant class data with those of previously determined differential spectra for plastics of known types to determine the ratio of agreement between the thus compared data (agreement ratio), and determining that the plastics showing the highest agreement ratio is the type of the plastics of the unknown type. By using the above-mentioned agreement ratio, it is possible to simply and rapidly determine the type of a plastics by means of the differential spectrum of near-infrared rays.

公开(公告)号：JPH06308022A

公开(公告)日：1994-11-04

申请号：JP2186593

申请日：1993-01-14

Applicant: TOA ELECTRONICS ,  PLAST SHIYORI SOKUSHIN KYOKAI

Inventor： AIKAWA KATSUAKI ,  SHIRATAMA TADASHI

IPC: G01J3/457 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/359 ,  G01N33/44

Abstract: PURPOSE:To simply and rapidly identify a type of plastic to sort plastic wastes according to their materials by applying near-infrared rays to plastic of an unknown type to measure an absorption spectrum. CONSTITUTION:Near-infrared rays are applied to plastic of an unknown type to measure an absorption spectrum, its differential spectrum is obtained, and the differential spectrum is observed at predetermined wavelength intervals over a measuring wavelength region. Whether the differential spectrum at each measuring wavelength is on a positive side, a negative side or a side other than these is determined, and a type of the differential spectrum at each measuring wavelength is compared with a differential spectrum obtained in advance on plastic of a known type, thereby identifying the type of an unknown spectrum. A differential spectrum of any order can be used, although a first-order differential spectrum or a second-order differential spectrum may be used.