公开(公告)号：EP4099079A1

公开(公告)日：2022-12-07

申请号：EP21747500.3

申请日：2021-01-27

Applicant: TOPCON CORPORATION

Inventor： OHMORI Kazuhiro

IPC: G02B21/22 ,  G02B21/06

Abstract: This operation microscope includes an objective lens, a first illumination optical system, a deflection unit, and an observation optical system. The first illumination optical system is disposed approximately coaxially with the optical axis of the objective lens, and configured to be able to irradiate an eye to be operated with first illumination light via the objective lens. The deflection unit deflects, in a direction crossing the optical axis, return light of the first illumination light incident from the eye to be operated via the objective lens. The observation optical system is configured to be able to guide the return light deflected by the defection unit to an eyepiece lens or an imaging element.

公开(公告)号：EP3942995A1

公开(公告)日：2022-01-26

申请号：EP20773788.3

申请日：2020-03-05

Applicant: TOPCON CORPORATION

Inventor： SHIMIZU Hitoshi ,  OHMORI Kazuhiro

IPC: A61B3/135 ,  G02B21/00

Abstract: The slit lamp microscope according to an exemplary embodiment comprises an illumination system and an imaging system. The illumination system radiates slit light to the anterior ocular segment of a subject eye. The imaging system includes an optical system for guiding light from the anterior ocular segment irradiated by the slit light, and an imaging element for receiving light guided by the optical system on an imaging plane. An object plane which includes the focus of the illumination system displaced by the refractive index of the tissue of the anterior ocular segment, a principal plane of the optical system, and the imaging plane are arranged so as to satisfy the Scheimpflug condition.