公开(公告)号：SG168518A1

公开(公告)日：2011-02-28

申请号：SG2010095412

申请日：2006-11-30

Applicant: TOUCHDOWN TECHNOLOGIES INC

Inventor： GARABEDIAN RAFFI ,  TEA NIM HAK ,  WANG STEVEN ,  KARKLIN HEATHER

Abstract: A probe card assembly (300) has a probe contactor substrate (310) having a plurality of probe contactor tips (395) thereon and a probe card wiring board (330) with an interposer (340) disposed between the two. Support posts (320) contacting the probe contactor substrate are vertically adjustable until secured by a locking mechanism (380) which is coupled to the probe card wiring board. When the posts are secured in a fixed position, the position is one in which the plane of the plurality of probe contactor substrates is substantially parallel to a predetermined reference plane.