Abstract:
A dual stage scanning instrument includes a sensor 60 for sensing a parameter of a sample 90 and coarse and fine stage 70,80 for causing relative motion between the sensor 60 and the sample 90. The coarse stage 80 has a resolution of about 1 micrometer and the fine stage 70 has a resolution of 1 nanometer or better. The sensor 60 is used to sense the parameter when both stages cause relative motion between the sensor assembly 60 and the sample 80. The sensor 60 may be used to sense height variations of the sample surface as well as thermal variations, electrostatic, magnetic, light reflectivity or light transmission parameters at the same time when height variation is sensed. By performing a long scan at a coarser resolution and short scans at high resolution using the same probe tips at fixed relative positions, data obtained from the long and short scans can be correlated accurately.