Operation method of resistive random access memory and resistive random access memory device

    公开(公告)号:US10475512B2

    公开(公告)日:2019-11-12

    申请号:US15776520

    申请日:2016-12-22

    Abstract: An operation method of a resistance random access memory and a resistance random access memory apparatus are provided. The method includes: applying an initial reset voltage to a storage unit; carrying out a read check operation to acquire a resistance value of the storage unit; judging whether the resistance value of the storage unit reaches a preset target resistance value in a high resistance state; if the resistance value of the storage unit is less than the preset target resistance value in the high resistance state, applying a set voltage to the storage unit to set the storage unit to a preset target resistance value in a low resistance state, then applying a reset voltage of which an amount is increased to the storage unit, and repeating the read check operation and the subsequent steps until the storage unit reaches the preset target resistance value in the high resistance state.

    Non-destructive In-situ Measurement Device and Method for High-Complexity Structures Based on Raman Analysis

    公开(公告)号:US20250020595A1

    公开(公告)日:2025-01-16

    申请号:US18897514

    申请日:2024-09-26

    Abstract: The present disclosure relates to a non-destructive in-situ measurement device and method based on Raman analysis. The device comprises: a laser light source that emits a laser beam; a focusing component that focuses the laser beam above a movable sample stage, with the focal plane of the focusing component positioned at an initial position. During measurement, the focal plane is controlled to move from the initial position to the surface, side, or bottom of the structure under test. The movable sample stage holds the sample to be measured and can move in a plane perpendicular and/or parallel to the optical axis. The axis of the structure under test is parallel to the optical axis and located within the laser beam's focal region. A detection module collects specific Raman scattering signals returned from the sample under test, and the structure's planar and three-dimensional parameters are determined based on the collected results.

    Operation Method of Resistive Random Access Memory and Resistive Random Access Memory Device

    公开(公告)号:US20180330788A1

    公开(公告)日:2018-11-15

    申请号:US15776520

    申请日:2016-12-22

    Abstract: An operation method of a resistance random access memory and a resistance random access memory apparatus are provided. The method includes: applying an initial reset voltage to a storage unit; carrying out a read check operation to acquire a resistance value of the storage unit; judging whether the resistance value of the storage unit reaches a preset target resistance value in a high resistance state; if the resistance value of the storage unit is less than the preset target resistance value in the high resistance state, applying a set voltage to the storage unit to set the storage unit to a preset target resistance value in a low resistance state, then applying a reset voltage of which an amount is increased to the storage unit, and repeating the read check operation and the subsequent steps until the storage unit reaches the preset target resistance value in the high resistance state.

    Method and device for storing time series data with adaptive length encoding

    公开(公告)号:US11101818B2

    公开(公告)日:2021-08-24

    申请号:US16769913

    申请日:2018-12-12

    Abstract: Provided are a method and device for storing time series data with adaptive length encoding, including: acquiring data values corresponding to timestamps according to a sequential order of timestamps; using a ratio of storage space values required to pre-store the previous n data values to storage space values required to pre-store rule information of a preset encoding rule and encoding data according to the previous n data values as a storage gain corresponding to the time at which the n-th data value is acquired; storing the rule information of the preset encoding rule and the encoding data corresponding to a previous n−1 data values when the storage gain corresponding to the time at which the n-th data value is acquired is less than that corresponding to the time at which the (n−1)-th data value is acquired.

    Multi-mode Sensor Based on Wafer-level Packaging and its Manufacturing Method

    公开(公告)号:US20250054851A1

    公开(公告)日:2025-02-13

    申请号:US18930233

    申请日:2024-10-29

    Abstract: The present disclosure relates to a multi-mode sensor based on wafer-level packaging and its manufacturing method. The sensor comprises a base for 3D packaging, a multi-mode sensor body, a cap layer, and multiple packaging structures. The base consists of a first substrate, a dielectric layer, a first insulating layer, and multiple through silicon vias (TSVs). The cap layer comprises a second substrate and a bonding ring, where the first surface of the second substrate is provided with a cavity for housing at least part of the multi-mode sensor body. This disclosure has the advantages of high integration, high performance, low cost, miniaturization, high reliability, process feasibility and compatibility, as well as high wafer-level uniformity, making it suitable for a wide range of applications.

    Capacity expansion method and capacity expansion system based on dual-level list structure

    公开(公告)号:US11467754B2

    公开(公告)日:2022-10-11

    申请号:US16959897

    申请日:2018-12-26

    Abstract: Provided are a capacity expansion method and a capacity expansion system based on a dual-level list structure; a first level list of the dual-level list structure is a first-level array in which at least one array identifier is stored; a second level list of the dual-level list structure includes at least one second-level array, each second-level array stores data to be stored and corresponds to only one array identifier; the method includes: creating a new first-level array when an amount of data stored in the second-level array corresponding to each array identifier reaches a maximum value, a size of a new first-level array being greater than that of a current first-level array, and increasing a number of the second-level arrays; and copying the array identifier stored in the current first-level array to the new first-level array, and replacing the current first-level array with the new first-level array.

Patent Agency Ranking