公开(公告)号：JPH11248685A

公开(公告)日：1999-09-17

申请号：JP36490098

申请日：1998-12-22

Applicant: UNITED TECHNOLOGIES CORP

Inventor： RAULERSON DAVID A ,  AMOS JAY ,  SMITH KEVIN D

IPC: G01N27/90

Abstract: PROBLEM TO BE SOLVED: To provide a probe with a wide inspection field by providing a driver having a length in a direction parallel with a scanning route and a width, and a receiver having an effective coil axis orthogonal to that of the driver a length in the same direction as the driver, a width larger thant the lath and a thickness. SOLUTION: An eddy current probe 28 is provided with a housing 60, a probe element 62, and an electrical connector 64. The element 62 is provided with a driver 70, a receiver 72 and a shield 74. The driver 70 is provided with a core and a driver coil. The effective axis of the driver coil is parallel with the main direction of a magnet field and in the vicinity of a main outside surface 76 of the receiver 72, and the magnetic field is even in the vicinity of the receiver 72. The receiver 72 is provided with a receiver coil and the effective axis of the receiver coil is arranged perpendicular to the effective axis of the driver coil to shield the magnetic field with respect to the receiver 72 and the driver 70. The receiver 72 has substantially at least a width which is about 1.25 times larger than the length of the receiver 72 so that it can cover a wide field.

公开(公告)号：SG74678A1

公开(公告)日：2000-08-22

申请号：SG1998004996

申请日：1998-11-26

Applicant: UNITED TECHNOLOGIES CORP

Inventor： RAULERSON DAVID A ,  AMOS JAY ,  SMITH KEVIN D

IPC: G01N27/90

Abstract: An eddy current probe (62) for use in inspecting an object, includes a driver (70) having a coil (82) with an effective coil axis (124), and further includes a receiver (72) having a coil (92) with a coil axis (126) oriented substantially perpendicular to the driver coil effective coil axis, the receiver having a length (134), and a width (130), the length being the dimension in the direction parallel to the scanning path (116), and the width having a dimension magnitude substantially greater than that of the length. A method for inspecting an object uses such an eddy current probe. An eddy current probe for use in inspecting an object, includes a driver (70) having a coil (82) with an effective coil axis (124), the driver having a length (132) and a width (128), the length being the dimension in a direction substantially parallel to a scanning path (116), and further includes a receiver (72) having a coil (92) with a coil axis (126) oriented substantially perpendicular to the driver coil effective coil axis, where the magnitude of a distance between the receiver and at least one of the driver edges (140,144) is less than 0.125 times the width of the driver. A method for inspecting an object uses such an eddy current probe.

公开(公告)号：CA2256904C

公开(公告)日：2005-10-18

申请号：CA2256904

申请日：1998-12-21

Applicant: UNITED TECHNOLOGIES CORP

Inventor： SMITH KEVIN D ,  RAULERSON DAVID A ,  AMOS JAY

IPC: G01N27/90

Abstract: An eddy current probe for use in inspecting an object, includes a driver having a coil with an effective coil axis, and further includes a receiver having a coil with a coil axis oriented substantially perpendicular to the driver coi l effective coil axis, the receiver having a length, and a width, the length being the dimension in the direction parallel to the scanning path, and the width havi ng a dimension magnitude substantially greater than that of the length. A method for inspecting an object uses such an eddy current probe. An eddy current probe for use in inspecting an object, includes a drive r having a coil with an effective coil axis, the driver having a length and a width, the length being the dimension in a direction substantially parallel to a scanning path, and further includes a receiver having a coil with a coil axis oriente d substantially perpendicular to the driver coil effective coil axis, where th e magnitude of a distance between the receiver and at least one of the edges i s less than 0.125 times the width of the driver. A method for inspecting an object uses such an eddy current probe.

公开(公告)号：CA2256904A1

公开(公告)日：1999-06-22

申请号：CA2256904

申请日：1998-12-21

Applicant: UNITED TECHNOLOGIES CORP

Inventor： AMOS JAY ,  SMITH KEVIN D ,  RAULERSON DAVID A

IPC: G01N27/90

Abstract: An eddy current probe for use in inspecting an object, includes a driver having a coil with an effective coil axis, and further includes a receiver havin g a coil with a coil axis oriented substantially perpendicular to the driver coil effective coil axis, the receiver having a length, and a width, the length being the dimension in the direction parallel to the scanning path, and the width having a dimension magnitude substantially greater than that of the length. A method for inspecting an object uses such an eddy current probe. An eddy current probe for use in inspecting an object, includes a driver having a coil with an effective coil axis, the driver having a length and a widt h, the length being the dimension in a direction substantially parallel to a scanni ng path, and further includes a receiver having a coil with a coil axis oriented substantially perpendicular to the driver coil effective coil axis, where the magnitude of a distance between the receiver and at least one of the edges is le ss than 0.125 times the width of the driver. A method for inspecting an object uses such an eddy current probe.